Author

Kotaro MIURA

Observed names: Kotaro Miura, Miura, Kotaro

Institution: Hirosaki University

Observed institution: Hirosaki University

ORCID: 0000-0002-5098-4410

Observed ORCID: 0000-0002-5098-4410

OpenAlex ID: A5017013637

Metal Interconnects for Electromigration Suppression Inspired by Tesla Valve

2026 · IEEE International Symposium on Reliability Physics 2026, Fujisaki, Kazuhiro, et al. · Underline Science Inc.

Influence of magnetic field on electromigration behavior in metallic thin interconnects under high-density electric current

2026 · Yusuke Souma, Kazuhiko Sasagawa, et al. · Thin Solid Films

Topology Optimization for the Electronic Line Considering Joule Heat

2025 · Keigo Sugawara, Kotaro Miura, et al. · ASME International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (InterPACK)

Effect of Backflow on Electromigration Damage in Die Attach Structure Using Sintered AG Joints

2025 · Kento Kainuma, Kazuhiko Sasagawa, et al. · ASME International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (InterPACK)

Topology Optimization for the Electronic Line Considering Joule Heat

2025 · Kotaro MIURA, Keigo SUGAWARA, et al. · Keisan Rikigaku Koenkai koen ronbunshu/Keisan Rikigaku Kouenkai kouen rombunshuu

Evaluation of Loop Formation Behavior of Elastic Wire Based on 3D Image Processing

2025 · Kyohei KUBOTA, Kazuhiro FUJISAKI, et al. · The Proceedings of the Materials and Mechanics Conference

An Attempt to Suppress Atomic Diffusion Under High-Density Current by Modifying The Geometry of Electronic Line

2025 · Kazuhiko SASAGAWA, Toshinari TOMABECHI, et al. · The Proceedings of the Materials and Mechanics Conference

Works count: 7

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