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Junji Maeshima
Observed names:
J. Maeshima,
Junji MAESHIMA,
Maeshima Junji,
前島, 淳司
Institution:
Sony (Japan)
Observed institutions:
Kyushu Institute of Technology,
Sony (Japan),
Sony Global Manufacturing & Operations Corporation (Japan)
OpenAlex ID:
A5017065711
Physics-Based Dipole Moment Source Reconstruction for RFI on a Practical Cellphone
2017
·
Qiaolei Huang
, Feng Zhang
, et al.
·
IEEE Transactions on Electromagnetic Compatibility
·
89
Model of Secondary ESD for a Portable Electronic Product
2011
·
Jiang Xiao
, D. Pommerenke
, et al.
·
IEEE Transactions on Electromagnetic Compatibility
·
34
System-Level Modeling for Transient Electrostatic Discharge Simulation
2015
·
Tianqi Li
, Viswa Pilla
, et al.
·
IEEE Transactions on Electromagnetic Compatibility
·
24
A study on correlation between near-field EMI scan and ESD susceptibility of ICs
2017
·
Ahmad Hosseinbeig
, Omid Hoseini Izadi
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
17
An application of utilizing the system-efficient-ESD-design (SEED) concept to analyze an LED protection circuit of a cell phone
2012
·
Tianqi Li
, Junji Maeshima
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
15
Measurement Techniques to Identify Soft Failure Sensitivity to ESD
2019
·
Jianchi Zhou
, Yuandong Guo
, et al.
·
IEEE Transactions on Electromagnetic Compatibility
·
12
Systematic analysis of ESD-induced soft-failures as a function of operating conditions
2018
·
Omid Hoseini Izadi
, Ahmad Hosseinbeig
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
12
Measurement techniques to predict the soft failure susceptibility of an IC without the aid of a complete software stack
2016
·
Suyu Yang
, Benjamin Orr
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
12
Noise coupling path analysis for RF interference caused by LCD noise modulation
2016
·
Chulsoon Hwang
, Sunkyu Kong
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
10
Modeling and Estimation of LCD Noise Modulation for Radio Frequency Interference
2017
·
Chulsoon Hwang
, David Pommerenke
, et al.
·
IEEE Transactions on Electromagnetic Compatibility
·
9
LCD baseband noise modulation estimation for radio frequency interference in mobile phones
2017
·
Chulsoon Hwang
, Sunkyu Kong
, et al.
·
Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
·
8
Wideband Noise Measurement Technique in Duplex Systems for RF Interference
2018
·
Chulsoon Hwang
, David Pommerenke
, et al.
·
IEEE Transactions on Electromagnetic Compatibility
·
4
Mirrored power distribution network noise injection for soft failure root cause analysis
2016
·
Suyu Yang
, Benjamin Orr
, et al.
·
Electrical Overstress/Electrostatic Discharge Symposium
·
4
Investigation of the ESD induced clock disturbances in portable electronic products
2013
·
Viswa Pilla
, Pratik Maheshwari
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
3
Wideband characterization of LCD baseband noise modulation for RF interference in mobile phones
2017
·
Chulsoon Hwang
, Takashi Enomoto
, et al.
·
IEEE International Symposium on Electromagnetic Compatibility
·
1
ソフト故障の根本原因分析のためのミラー型配電網雑音注入【Powered by NICT】
2016
·
Yang Suyu
, Orr Benjamin
, et al.
·
IEEE Conference Proceedings
高システム効率esd設計(seed)概念を活用することの携帯電話のled保護回路解析への応用
2012
·
Tianqi Li
, Maeshima Junji
, et al.
·
International Symposium on Electromagnetic Compatibility
Solar Array Panel Equivalent Circuit Model for Transient Analysis of Electrostatic Discharge
2010
·
Junji MAESHIMA
, Mengu CHO
·
TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES AEROSPACE TECHNOLOGY JAPAN
PDF
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Works count:
19
Citation count:
254
H-index:
9
I10-index:
9
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