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Hsin Tseng

Observed names: H. H. Tseng, H. Tseng, H.-H. Tseng, H.-h. Tseng, H.H. Tseng, Hsing Huang Tseng, Hsing Tseng, Tseng, Hsin
ORCID: 0000-0002-9749-3950
Observed ORCID: 0000-0002-9749-3950
OpenAlex ID: A5017441398
Reservoir computing with biocompatible organic electrochemical networks for brain-inspired biosignal classification
2021 · Matteo Cucchi, Christopher Gruener, et al. · Science Advances · 200
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Gate stack technology for nanoscale devices
2006 · Byoung Hun Lee, Jungwoo Oh, et al. · Materials Today · 173
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Photopatternable solid electrolyte for integrable organic electrochemical transistors: operation and hysteresis
2022 · Anton Weissbach, Lukas M. Bongartz, et al. · Journal of Materials Chemistry C · 78
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Breakdown in the metal/high-k gate stack: Identifying the “weak link” in the multilayer dielectric
2008 · G. Bersuker, D. Heh, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 76
Low-Frequency Noise in Submicrometer MOSFETs With HfO $_2$ , HfO $_2/hbox Al_2hbox O_3$ and HfAlO $_x$ Gate Stacks
2004 · B. Min, S.P. Devireddy, et al. · IEEE Transactions on Electron Devices · 60
Thermodynamics of organic electrochemical transistors
2022 · Matteo Cucchi, Anton Weissbach, et al. · Nature Communications · 56
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Directed Growth of Dendritic Polymer Networks for Organic Electrochemical Transistors and Artificial Synapses
2021 · Matteo Cucchi, Hans Kleemann, et al. · Advanced Electronic Materials · 56
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The effect of silicon gate microstructure and gate oxide process on threshold voltage instabilities in p/sup +/-gate p-channel MOSFETs with fluorine incorporation
1992 · H.-H. Tseng, P.J. Tobin, et al. · IEEE Transactions on Electron Devices · 37
Nanographene‐Based Heterojunctions for High‐Performance Organic Phototransistor Memory Devices
2023 · Shaoling Bai, Lin Yang, et al. · Advanced Science · 36
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Membrane-Free, Selective Ion Sensing by Combining Organic Electrochemical Transistors and Impedance Analysis of Ionic Diffusion
2021 · Hsin Tseng, Matteo Cucchi, et al. · ACS Applied Electronic Materials · 29
Coffee-Ground-Derived Nanoporous Carbon Anodes for Sodium-Ion Batteries with High Rate Performance and Cyclic Stability
2020 · Peng-Hsuan Chiang, Shih-Fu Liu, et al. · Energy & Fuels · 27
Unraveling the Electrochemical Electrode Coupling in Integrated Organic Electrochemical Transistors
2023 · Anton Weissbach, Matteo Cucchi, et al. · Advanced Functional Materials · 26
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Strain additivity in III-V channels for CMOSFETs beyond 22nm technology node
2008 · S. Suthram, Y. Sun, et al. · Symposium on VLSI Technology · 26
Threshold Voltage Control in Dual‐Gate Organic Electrochemical Transistors
2022 · Hsin Tseng, Anton Weissbach, et al. · Advanced Materials Interfaces · 25
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80 nm poly-Si gate CMOS with HfO/sub 2/ gate dielectric
2002 · C. Hobbs, H. Tseng, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 23
Device Physics, Modeling and Simulation of Organic Electrochemical Transistors
2023 · Malte Koch, Hsin Tseng, et al. · IEEE Journal of the Electron Devices Society · 17
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Mechanisms limiting EOT scaling and gate leakage currents of high-k/metal gate stacks directly on SiGe and a method to enable sub-1nm EOT
2008 · J. Huang, P. D. Kirsch, et al. · Symposium on VLSI Technology · 15
A comparison of CVD stacked gate oxide and thermal gate oxide for 0.5- mu m transistors subjected to process-induced damage
1993 · H.-H. Tseng, P.J. Tobin, et al. · IEEE Transactions on Electron Devices · 11
Growth and design strategies of organic dendritic networks
2022 · Giuseppe Ciccone, Matteo Cucchi, et al. · Discover Materials · 9
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Sub-quarter micron Si-gate CMOS with ZrO/sub 2/ gate dielectric
2002 · C. Hobbs, L. Dip, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 7
Numerical Modeling of Organic Electrochemical Transistors
2022 · Malte Koch, Hsin Tseng, et al. · IEEE Latin American Electron Devices Conference (LAEDC) · 6
Integrated Top‐Gate Organic Electrochemical Transistors: A Scalable Approach for Fast and Efficient Operation
2024 · Ali Solgi, Anton Weissbach, et al. · Advanced Electronic Materials · 5
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Critical Components of FinFet Integration: Examining the Density Trade-off and Process Integration for FinFET Implementation
2007 · Rusty Harris, M. Hussain, et al. · ECS Transactions · 5
Sub-quarter micron CMOS process for TiN-gate MOSFETs with TiO/sub 2/ gate dielectric formed by titanium oxidation
1999 · C. Hobbs, R. Hegde, et al. · Symposium on VLSI Technology · 4
Structural evolution and on-demand growth of artificial synapses via field-directed polymerization
2021 · Cucchi, Matteo, Kleemann, Hans, et al. · arXiv (Cornell University) · 3
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Works count: 39
Citation count: 1,016
H-index: 16
I10-index: 18
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