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Author

Chunlin Lv

Observed name: Lv, Chunlin
ORCID: 0000-0002-9395-0819
Observed ORCID: 0000-0002-9395-0819
OpenAlex ID: A5017719005
A Method to Characterize the Shrinking of Safe Operation Area of Metallized Film Capacitor Considering Electrothermal Coupling and Aging in Power Electronics Applications
2022 · Chunlin Lv, Jinjun Liu, et al. · IEEE Transactions on Industrial Electronics · 40
Reliability Modeling for Metallized Film Capacitors Based on Time-Varying Stress Mission Profile and Aging of ESR
2020 · Chunlin Lv, Jinjun Liu, et al. · IEEE Journal of Emerging and Selected Topics in Power Electronics · 32
An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process
2020 · Chunlin Lv, Jinjun Liu, et al. · Microelectronics Reliability · 27
A High-Resolution Analytical Thermal Modeling Method of Capacitor Bank Considering Thermal Coupling and Different Cooling Modes
2023 · Chunlin Lv, Jinjun Liu, et al. · IEEE Transactions on Power Electronics · 24
Reliability Analysis and Design of MMC Based on Mission Profile for the Components Degradation
2020 · Gaotai Lv, Wanjun Lei, et al. · IEEE Access · 17
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A thermal network model for monitoring IGBT chip solder degradation based on feedback PI control
2022 · Xiaotong Zhang, Wei Mu, et al. · Microelectronics Reliability · 13
A data-driven method for anomaly detection and aging model parameter estimation of capacitors based on condition monitoring
2022 · Chunlin Lv, Jinjun Liu, et al. · Microelectronics Reliability · 12
Capacitor Lifetime-Based Power Routing of ISOP-DAB Converter Within Comprehensive Constraint
2021 · Rui Cao, Yan Zhang, et al. · IEEE Transactions on Industrial Electronics · 12
A thermal network model considering thermal coupling effect and TIM degradation in IGBT modules
2023 · Xiaotong Zhang, Zhuolin Cheng, et al. · Energy Reports · 9
Thermal Modeling of Power Semiconductor Devices with Heat Sink Considering Ambient Temperature Dynamics
2020 · Rui Cao, Yang Li, et al. · 6
Redundant Design of Modular DC Solid-State Transformer Based on the Long Term Reliability Evaluation
2020 · Rui Cao, Yan Zhang, et al. · International Conference on HVDC (HVDC) · 6
A High-Efficiency LLC Resonant Converter Based on Partial Power Processing for PV Applications
2024 · Shaopeng Xue, Yan Zhang, et al. · 5
A method to improve the accuracy and efficiency for metallized-film capacitor's reliability assessment using joint simulation
2021 · Jinpeng Yin, Jinjun Liu, et al. · Microelectronics Reliability · 5
Storage Lifetime Prognosis of an Intermediate Frequency (if) Amplifier Based on Physics of Failure Method
2013 · Sung Taik Hong, Zhigang Zhou, et al. · Chemical engineering transactions · 3
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Robust Online Capacitance Estimation for MMC Submodules Using a Soft-Constrained Extended Kalman Filter
2025 · Pingjunjin Tan, Chunlin Lv, et al. · IEEE International Power Electronics and Application Symposium (PEAS) · 2
Investigation on the Dominant Threshold Voltage Drift Mechanism in SiC MOSFETs Under Hard-Switching Stress
2025 · Shaopeng Xue, Yan Zhang, et al. · IEEE Transactions on Electron Devices · 2
A 3-D Thermal Network Model for IGBT Modules Considering Temperature Dependence of Heat Dissipation and Thermal Coupling
2024 · Xiaotong Zhang, Xiangqian Tong, et al. · 2
Capacitor Damage-Based Power Routing Strategy in ISOP-DAB Converters for Smart Grid
2021 · Xue Liu, Yan Zhang, et al. · 1
Parameter Estimation of Power Electronic Converters with Differentiable Physics Simulation
2026 · Tan, Pingjunjin, Lv, Chunlin, et al. · arXiv (Cornell University)
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Online Parameter Estimation Based Digital Twin and EKF for Health Indicators of Buck Converters
2026 · Boyang Jin, Chunlin Lv, et al. · International Power Electronics Conference (IPEC)
A Reliability Assessment Method for KEY Components of Flexible DC Converter Valves Considering the Coexistence of Sudden Failure and Aging Failure
2026 · Boyi Fang, Chang Ruan, et al.
Effects of Bipolar Degradation on SiC MOSFET Package Reliability Evaluation
2025 · Yang Li, Yifei Wu, et al.
LS-SVM based capacitor anomaly identification method
2024 · Chunlin Lv, Yuxi Deng, et al.
Capacitor Health Evaluation Method Considering Stochasticity from Multiple Independent Sources
2023 · Chunlin Lv, Jinjun Liu, et al. · IEEE International Power Electronics and Application Symposium (PEAS)
IGBT Long-Term Forward Bias Safe Operating Area Calibration Considering Aging-Caused Shrinkage
2022 · Yang Li, Jinjun Liu, et al. · IEEE International Power Electronics and Application Conference and Exposition (PEAC)
Works count: 25
Citation count: 218
H-index: 9
I10-index: 8
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