Author

Mathias Klenner

Observed names: Klenner Mathias, Klenner, Mathias, M. Klenner

Observed institutions: University of Freiburg, Fraunhofer Institute for Applied Solid State Physics

ORCID: 0000-0002-3471-826X

Observed ORCID: 0000-0002-3471-826X

OpenAlex ID: A5018232113

Spectroscopic Measurement of Material Properties Using an Improved Millimeter-Wave Ellipsometer Based on Metallic Substrates

2016 · Mathias Klenner, Christian Zech, et al. · IEEE Transactions on Instrumentation and Measurement · 9

Multilayer material analysis using an active millimeter wave imaging system

2013 · Mathias Klenner, Christian Zech, et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 9

Analysis of glass fiber reinforced plastics using a focusing W-band radar system

2017 · Dominik Meier, Christian Zech, et al. · IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS) · 7

A portable W-band radar system for enhancement of infrared vision in fire fighting operations

2016 · Mathias Klenner, Christian Zech, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7

Characterization of quasi-optical focusing systems at W-band frequencies

2015 · Mathias Klenner, Christian Zech, et al. · European Microwave Conference (EuMC) · 3

Radar system components to detect small and fast objects

2015 · Axel Hülsmann, Christian Zech, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3

Analysis of Dielectric Properties of Layered Plastics at W-Band Frequencies

2014 · Mathias Klenner, Christian Zech, et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 3

Compact quasi-optical focusing system for a 94 GHz FMCW radar

2014 · Mathias Klenner, Christian Zech, et al. · International Radar Symposium · 3

Investigation of dielectric properties of multilayer structures consisting of homogeneous plastics and liquid solutions at 75–110 GHz

2015 · M. Klenner, T. Abels, et al. · Journal of sensors and sensor systems · 2

Material characterization using a compact W-band ellipsometer

2016 · Mathias Klenner, Christian Zech, et al. · European Microwave Conference (EuMC) · 1

Spectroscopic millimeter wave ellipsometry

2017 · Klenner, Mathias · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)

小型Wバンド偏光解析装置を用いた材料特性化【Powered by NICT】

2016 · Klenner Mathias, Zech Christian, et al. · IEEE Conference Proceedings

Works count: 13

Citation count: 47

H-index: 4

I10-index: