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Karen D. Vernon-Parry

Observed names: K D Vernon-Parry, K D Vernon-parry, K. D. Vernon-Parry, K. Vernon-Parry, K.D Vernon-Parry, K.D. Vernon-Parry, K.D. Vernon–Parry, KD Vernon-Parry, Karen Vernon-Parry, Karen Vernon-parry, Vernon-Parry, K. D.
ORCID: 0000-0002-5844-9017
Observed ORCID: 0000-0002-5844-9017
OpenAlex ID: A5018570652
Scanning electron microscopy: an introduction
2000 · K.D. Vernon-Parry · III-Vs Review · 332
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Hydrogen reactions with electron irradiation damage in silicon
1999 · A.R Peaker, J.H Evans-Freeman, et al. · Physica B Condensed Matter · 29
Deformation microstructure and texture in hot worked aluminium alloys
1996 · K. D. Vernon-Parry, T. Furu, et al. · Materials Science and Technology · 22
Deep level transient spectroscopy study of the effect of Mn and Bi doping on trap formation in ZnO
2010 · Colin Leach, Karen D. Vernon-Parry, et al. · Journal of Electroceramics · 17
Deposition of thallium-based superconducting thin films by a simple thermal evaporation method
1991 · H C Lai, K D Vernon-Parry, et al. · Superconductor Science and Technology · 14
Effect of doping on electronic states in B-doped polycrystalline CVD diamond films
2012 · O S Elsherif, K D Vernon-Parry, et al. · Semiconductor Science and Technology · 12
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The effect of sintering temperature on the development of grain boundary traps in zinc oxide based varistors
2006 · C. Leach, K. Vernon-Parry · Journal of Materials Science · 12
Electronic and structural properties of grain boundaries in electron-irradiated edge-defined film-fed growth silicon
2005 · K D Vernon-Parry, G Davies, et al. · Semiconductor Science and Technology · 11
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Erbium-doped Si1-xGex/Si structures for light emitting diodes
2000 · A T Naveed, J H Evans-Freeman, et al. · Semiconductor Science and Technology · 10
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Distribution of yttrium in aluminium containing stainless steels and its effect on structure of oxide layers
1988 · K. D. Vernon-Parry, C. R. M. Grovenor, et al. · Materials Science and Technology · 10
Characterization of defects in Mg doped GaN epitaxial layers using conductance measurements
2011 · O.S. Elsherif, K.D. Vernon-Parry, et al. · Thin Solid Films · 8
Carbon-related centres in irradiated SiGe alloys
2003 · S. Hayama, G. Davies, et al. · Physica B Condensed Matter · 8
Annealing behaviour of dilute aluminium alloys following hot deformation
1996 · R.K. Bolingbroke, T. Furu, et al. · Materials Science and Technology · 8
Effect of dislocations on the photoluminescence decay of 1.54 μm emission from erbium-doped silicon
2001 · K. D. Vernon-Parry, J. H. Evans-Freeman, et al. · Journal of Applied Physics · 7
The degradation process in Tl2Ba2Ca1Cu2O10+x
1990 · K.D. Vernon-Parry, L.T. Romano, et al. · Physica C Superconductivity · 7
Potential Synthesis of Solar-Grade Silicon from Rice Husk Ash
2015 · B.O. Ayomanor, Karen Vernon-Parry · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 6
A comparison of the photoluminescence decay of erbium in silicon and silicon-germanium
2001 · K.D. Vernon-Parry, I.D. Hawkins, et al. · Materials Science and Engineering B · 6
Optical and electrical activity of defects in rare earth implanted Si
2005 · J.H. Evans-Freeman, K.D. Vernon-Parry · Optical Materials · 5
Proceedings of the 26th International Conference on Defects in Semiconductors (ICDS-26)
2012 · Jan Evans-Freeman, Karen Vernon-Parry, et al. · Physica B Condensed Matter · 4
The use of electron back-scattered diffraction to study the regrowth of amorphised silicon-based heterostructures
2001 · K.D. Vernon-Parry, K.F. Abd-El-Rahman, et al. · Materials Science in Semiconductor Processing · 4
Electrical Characterisation of Defects in Polycrystalline B-Doped Diamond Films
2012 · Osama S. Elsherif, Karen D. Vernon-Parry, et al. · Materials science forum · 3
Characterisation of defects in p-GaN by admittance spectroscopy
2011 · O.S. Elsherif, K.D. Vernon-Parry, et al. · Physica B Condensed Matter · 3
High resolution deep level transient spectroscopy applied to extended defects in silicon
2005 · J H Evans-Freeman, D Emiroglu, et al. · Journal of Physics Condensed Matter · 3
What does good engineering laboratory pedagogy look like
2016 · J Goodwin-Jones, Anne Nortcliffe, et al. · SHURA (Sheffield Hallam University Research Archive) (Sheffield Hallam University) · 2
High resolution deep level transient spectroscopy and process-induced defects in silicon
2004 · J.H. Evans-Freeman, D. Emiroglu, et al. · Materials Science and Engineering B · 1
Works count: 41
Citation count: 547
H-index: 10
I10-index: 10
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