Author

Xin Tan

Observed names: TAN Xin, Tan Xin, X. Tan, Xin Kun Tan
ORCID: 0000-0003-2609-3172
Observed ORCID: 0000-0003-2609-3172
OpenAlex ID: A5018783368
2018 · Yuanjie Lv, Xingye Zhou, et al. · IEEE Electron Device Letters · 114
2018 · Xingye Zhou, Tingting Han, et al. · IEEE Electron Device Letters · 37
2018 · Yuanjie Lv, Jianghui Mo, et al. · Superlattices and Microstructures · 35
2019 · Yuanjie Lü, Xubo Song, et al. · Journal of Semiconductors · 25
2019 · Xin Tan, Yuanjie Lv, et al. · Microelectronic Engineering · 22
2019 · Xingye Zhou, Zhihong Feng, et al. · IEEE Electron Device Letters · 22
2018 · Xingye Zhou, Xin Tan, et al. · IEEE Transactions on Electron Devices · 19
2015 · Xingye Zhou, Zhihong Feng, et al. · Solid-State Electronics · 16
2023 · Cheng-hao Yu, Hao-min Guo, et al. · Microelectronics Reliability · 15
2019 · Xingye Zhou, Xin Tan, et al. · Chinese Optics Letters · 14
2020 · Xingye Zhou, Xin Tan, et al. · IEEE Transactions on Electron Devices · 13
2018 · X. Tan, Y. J. Lv, et al. · AIP Advances · 12
2009 · Jiajue Chai, Xiaogang Zhang, et al. · The Journal of Supercritical Fluids · 12
2020 · Xingye Zhou, Xin Tan, et al. · Optics Express · 11
2016 · Xin Tan, Xing-Ye Zhou, et al. · Chinese Physics Letters · 10
2020 · Xingye Zhou, Xin Tan, et al. · IEEE Photonics Technology Letters · 9
2017 · Yuangang Wang, Yuanjie Lv, et al. · IEEE Electron Device Letters · 9
2019 · Xubo Song, Lisen Zhang, et al. · IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) · 6
2024 · Cheng-Hao Yu, Hui Yang, et al. · IEEE Transactions on Device and Materials Reliability · 5
2020 · Xingye Zhou, Xin Tan, et al. · Electronics Letters · 5
2016 · Xubo Song, Yuanjie Lü, et al. · Journal of Semiconductors · 4
Works count: 52
Citation count: 633
H-index: 13
I10-index: 18
Year
Topic
Type