Author

Yann Reibel

Observed name: Y. Reibel
OpenAlex ID: A5019211960
2002 · Y. Reibel, M. Jung, et al. · The European Physical Journal Applied Physics · 73
2013 · A. Rouvié, O. Huet, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 40
2012 · A. Kerlain, G. Bonnouvrier, et al. · Journal of Electronic Materials · 34
2011 · Yann Reibel, Fabien Chabuel, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 34
2015 · Yann Reibel, R. Taalat, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 30
2014 · J. Coussement, A. Rouvié, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 24
2012 · M. Vuillermet, D. Billon-Lanfrey, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 19
2011 · Guillaume Druart, Florence de la Barriere, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 17
2015 · Yann Reibel, Nicolas Péré-Laperne, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 14
2013 · Y. Reibel, A. Rouvie, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2017 · Laurent Rubaldo, Rachid Taalat, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 11
2014 · Y. Reibel, N. Pere-Laperne, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 11
2017 · Johan Rothman, Eric de Broniol, et al. · International Conference on Space Optics (ICSO) · 8
2016 · Yann Reibel, Laurent Espuno, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2015 · L. Espuno, O. Pacaud, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2002 · A. Dubois, L. Vabre, et al. · The European Physical Journal Applied Physics · 8
2014 · P. Castelein, N. Baier, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2014 · Guillaume Druart, Noura Matallah, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2012 · Yann Reibel, Laurent Rubaldo, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2012 · Guillaume Druart, Florence de la Barriere, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2011 · Yann Reibel, Laurent Rubaldo, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2010 · Yann Reibel, Laurent Rubaldo, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2012 · M. Vuillermet, D. Billon-Lanfrey, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2014 · Johan Rothman, Kevin Foubert, et al. · IEEE Workshop on Low Temperature Electronics (WOLTE) · 2
Works count: 35
Citation count: 408
H-index: 11
I10-index: 12
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