Author

William J. Bowhill

Observed names: W. Bowhill, W.J. Bowhill
Observed institution: Intel (United States)
OpenAlex ID: A5019481901
2000 · Anantha Chandrakasan, William J. Bowhill, et al. · Institute of Electrical and Electronics Engineers eBooks · 797
1998 · P.E. Gronowski, W.J. Bowhill, et al. · IEEE Journal of Solid-State Circuits · 308
1995 · B.J. Benschneider, A.J. Black, et al. · IEEE Journal of Solid-State Circuits · 88
1995 · William J. Bowhill, Shane Bell, et al. · Digital technical journal · 85
2005 · R.P. Preston, R.W. Badeau, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 68
1996 · P.E. Gronowski, W.J. Bowhill, et al. · IEEE Journal of Solid-State Circuits · 68
2002 · W.J. Bowhill, R.L. Allmon, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 56
2002 · R.P. Preston, R.W. Badeau, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 42
2002 · P.E. Gronowski, P. Bannon, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 23
1989 · B.J. Benschneider, W.J. Bowhill, et al. · IEEE Journal of Solid-State Circuits · 21
2003 · B.J. Benschneider, W.J. Bowhill, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 11
1992 · R.W. Badeau, R.I. Bahar, et al. · IEEE Journal of Solid-State Circuits · 11
2003 · R.L. Allmon, W.J. Bowhill, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 10
2003 · R. Badeau, R.I. Bahar, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 8
2005 · W.J. Bowhill, A. Chandrakasan, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 3
2002 · D.K. Bhavsar, U. Echeruo, et al. · IEEE International Test Conference (ITC) · 3
2009 · Anantha Chandrakasan, William J. Bowhill, et al. · Institute of Electrical and Electronics Engineers eBooks · 2
2009 · Anantha Chandrakasan, William J. Bowhill, et al. · Institute of Electrical and Electronics Engineers eBooks · 1
2009 · Anantha Chandrakasan, William J. Bowhill, et al. · Institute of Electrical and Electronics Engineers eBooks · 1
1996 · P. Gillingham, W. Bowhill, et al. · IEEE Journal of Solid-State Circuits
Works count: 20
Citation count: 1,606
H-index: 11
I10-index: 13
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