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Steven Kasapi

Observed name: S. Kasapi
OpenAlex ID: A5019486531
Atomic velocity selection using stimulated Raman transitions
1991 · Mark Kasevich, David S. Weiss, et al. · Physical Review Letters · 305
Improved magneto-optic trapping in a vapor cell
1992 · Kurt E. Gibble, Steven Kasapi, et al. · Optics Letters · 163
Laser Voltage Imaging: A New Perspective of Laser Voltage Probing
2010 · Yin S. Ng, Ted Lundquist, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 52
Amplitude-squeezed, frequency-modulated, tunable, diode-laser-based source for sub-shot-noise FM spectroscopy
1997 · Steven Kasapi, Seema Lathi, et al. · Optics Letters · 49
New photon detector for device analysis: Superconducting single-photon detector based on a hot electron effect
2001 · Seema Somani, Steven Kasapi, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 45
Prospects of Time-Resolved Photon Emission as a Debug Tool
2002 · Jim Vickers, Nader Pakdaman, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 23
Sub-shot-noise frequency-modulation spectroscopy by use of amplitude-squeezed light from semiconductor lasers
2000 · Steven Kasapi, Seema Lathi, et al. · Journal of the Optical Society of America B · 21
Scan chain failure analysis using laser voltage imaging
2010 · Joy Y. Liao, Steven Kasapi, et al. · Microelectronics Reliability · 20
Laser beam backside probing of CMOS integrated circuits
1999 · Steven Kasapi, Chun-Cheng Tsao, et al. · Microelectronics Reliability · 19
Advanced Scan Chain Failure Analysis Using Laser Modulation Mapping and Continuous Wave Probing
2011 · Steven Kasapi, William Lo, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 16
Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology
2008 · Ulrike Kindereit, Christian Boit, et al. · Microelectronics Reliability · 16
Physical IC debug – backside approach and nanoscale challenge
2008 · C. Boit, R. Schlangen, et al. · Advances in radio science · 15
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Time-resolved photon counting system based on a Geiger-mode InGaAs/InP APD and a solid immersion lens
2004 · J.S. Vickers, R. Ispasoiu, et al. · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 15
Waveform Acquisition from the Backside of Silicon Using Electro-Optic Probing
1999 · Mike Bruce, Greg Dabney, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 15
Advanced scan chain failure analysis using laser modulation mapping and continuous wave probing
2012 · Steven Kasapi, William Lo, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 12
PC Card Based Optical Probing of Advanced Graphics Processor Using Time Resolved Emission
2003 · Howard Lee Marks, Tung Ton, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 11
Practical, non-invasive optical probing for flip-chip devices
2002 · G. Dajee, N. Goldblatt, et al. · IEEE International Test Conference (ITC) · 11
Voltage Noise and Jitter Measurement Using Time-Resolved Emission
2006 · Steven Kasapi, Gary L. Woods · Proceedings - International Symposium for Testing and Failure Analysis · 8
Comparison of Laser and Emission Based Optical Probe Techniques
2001 · William K. Lo, Steven Kasapi, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 8
Evaluating PICA Capability for Future Low Voltage SOI Chips
2008 · Franco Stellari, Peilin Song, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 7
Spectrally- and temporally-resolved dynamic emission from CMOS ICs
2004 · G.L. Woods, S. Kasapi · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 7
Reduction of the acquisition time for CMOS time-resolved photon emission by optimized IR detection
2006 · Radu Ispasoiu, Tom Crawford, et al. · Microelectronics Reliability · 5
Sub-shot-noise FM noise spectroscopy of trapped rubidium atoms
1998 · Steven Kasapi, Seema Lathi, et al. · Journal of the Optical Society of America B · 5
Phase-sensitive frequency-modulation noise spectroscopy with a diode laser
1996 · S. Lathi, S. Kasapi, et al. · Optics Letters · 5
Comparison of applications of laser probing, laser-induced circuit perturbation and photon emission for failure analysis and yield enhancement
2012 · Steven Kasapi, Roy Ng, et al. · IEEE International Reliability Physics Symposium proceedings · 4
Works count: 34
Citation count: 866
H-index: 14
I10-index: 17
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