Author

Mark Bieler

Observed names: Bieler Mark, Bieler, M., Bieler, Mark, M Bieler, M. Bieler
ORCID: 0000-0002-5706-5417
Observed ORCID: 0000-0002-5706-5417
OpenAlex ID: A5019883244
2005 · N. Laman, M. Bieler, et al. · Journal of Applied Physics · 95
2013 · Rohan Singh, Travis M. Autry, et al. · Physical Review B · 46
2006 · M. Bieler, K. Pierz, et al. · Journal of Applied Physics · 46
2011 · H Füser, S Eichstädt, et al. · Measurement Science and Technology · 43
2020 · Xiukun Hu, Gaoliang Dai, et al. · IEEE Transactions on Instrumentation and Measurement · 34
2011 · Heiko Füser, Rolf Judaschke, et al. · Applied Physics Letters · 34
2015 · Mark Bieler, Heiko Fuser, et al. · IEEE Transactions on Microwave Theory and Techniques · 29
2008 · C. Jördens, T. Schlauch, et al. · Applied Physics B · 29
2005 · S Seitz, M Bieler, et al. · Measurement Science and Technology · 27
2012 · M. Winter, H. Füser, et al. · AIP conference proceedings · 26
2007 · M. Bieler, S. Seitz, et al. · IEEE Transactions on Instrumentation and Measurement · 26
2008 · M. Bieler, M. Spitzer, et al. · IEEE Transactions on Instrumentation and Measurement · 25
2013 · Heiko Füser, Mark Bieler · Journal of Infrared Millimeter and Terahertz Waves · 22
2012 · Shekhar Priyadarshi, Klaus Pierz, et al. · Physical Review Letters · 22
2012 · Paul D. Hale, Dylan F. Williams, et al. · Conference on Precision Electromagnetic Measurements · 22
2010 · S. Priyadarshi, A. M. Racu, et al. · Physical Review Letters · 22
2009 · Shekhar Priyadarshi, Markus Leidinger, et al. · Applied Physics Letters · 22
2008 · T. Kleine-Ostmann, T. Schrader, et al. · Frequenz · 21
2015 · Shekhar Priyadarshi, Klaus Pierz, et al. · Physical Review Letters · 20
2000 · M. Bieler, G. Hein, et al. · Applied Physics Letters · 20
2020 · Mark Bieler, Paul Struszewski, et al. · Conference on Precision Electromagnetic Measurements · 18
2000 · M. Koch, M. Bieler, et al. · physica status solidi (b) · 18
Works count: 157
Citation count: 1,112
H-index: 21
I10-index: 35
Year
Topic
Type