Author

A. Bourenane

Observed names: A. BOURENANE, Ahmed Bourenane, Bourenane, Ahmed

Observed institution: University Ferhat Abbas of Setif

OpenAlex ID: A5020127781

Influence of thickness and porous structure of SiC layers on the electrical properties of Pt/SiC-pSi and Pd/SiC-pSi Schottky diodes for gas sensing purposes

2007 · Karima Bourenane, Aissa Keffous, et al. · Sensors and Actuators B Chemical · 23

Spatial resolution limit study of a CCD camera and scintillator based neutron imaging system according to MTF determination and analysis

2011 · F. Kharfi, O. Denden, et al. · Applied Radiation and Isotopes · 15

STRUCTURAL AND OPTICAL PROPERTIES OF POLYCRYSTALLINE 6H-SiC AND CRYSTALLINE SiC FILM GROWN ONTO SILICON SUBSTRATE BY PLD

2008 · A. KEFFOUS, K. BOURENANE, et al. · Modern Physics Letters B · 5

Lithium-drifted, silicon radiation detectors for harsh radiation environments

2008 · J. Grant, C. Buttar, et al. · Journal of Materials Science Materials in Electronics · 3

A STUDY ON THE PHOTOLUMINESCENCE PROPERTIES OF POROUS 6H-SiC (p) AND SiC FILM ON p- Si SUBSTRATE

2008 · K. BOURENANE, A. KEFFOUS, et al. · Modern Physics Letters B · 3

Lithium-drifted silicon for harsh radiation environments

2008 · J. Grant, C. Buttar, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1

Integrated Experience Feedback-Knowledge Management Approach for Enhanced Safety of a Research Reactor

2025 · Bourenane, Ahmed · Algerian Journal of Engineering and Technology

Works count: 7

Citation count: 50

H-index: 3

I10-index: 2