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Aaron Hendrickson

Observed names: Aaron J. Hendrickson, Hendrickson, Aaron, Hendrickson, Aaron J.
ORCID: 0000-0003-0464-6768
Observed ORCID: 0000-0003-0464-6768
OpenAlex ID: A5020277199
Photon Counting Histogram Expectation Maximization Algorithm for Characterization of Deep Sub-Electron Read Noise Sensors
2023 · Aaron J. Hendrickson, David P. Haefner · IEEE Journal of the Electron Devices Society · 8
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Centralized inverse-Fano distribution for controlling conversion gain measurement accuracy of detector elements
2017 · Aaron J. Hendrickson · Journal of the Optical Society of America A · 8
On the optimal measurement of conversion gain in the presence of dark noise
2022 · Aaron Hendrickson, David P. Haefner, et al. · Journal of the Optical Society of America A · 6
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The inverse gamma-difference distribution and its first moment in the Cauchy principal value sense
2019 · Aaron Hendrickson · Statistics and Its Interface · 5
PCH-EM: A Solution to Information Loss in the Photon Transfer Method
2024 · Aaron J. Hendrickson, David P. Haefner, et al. · IEEE Transactions on Electron Devices · 4
A comparative study of methods to estimate conversion gain in sub-electron and multi-electron read noise regimes
2023 · Aaron Hendrickson, David P. Haefner · Infrared Imaging Systems: Design, Analysis, Modeling, and Testing · 3
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Experimental Verification of PCH-EM Algorithm for Characterizing DSERN Image Sensors
2023 · Aaron J. Hendrickson, David P. Haefner, et al. · IEEE Journal of the Electron Devices Society · 3
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Photon Counting Accuracy in Digital Image Sensors
2023 · Hendrickson, Aaron J. · arXiv (Cornell University) · 1
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A novel approach to photon transfer conversion gain estimation
2021 · Hendrickson, Aaron · arXiv (Cornell University) · 1
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Valley-peak modulation in phase space: a law-invariant VPM and its theta-function structure
2026 · Aaron J. Hendrickson, David P. Haefner · Optics Express
From photon transfer to maximum likelihood: a statistician's perspective on sensor characterization
2026 · Aaron J. Hendrickson, David P. Haefner · Infrared Imaging Systems: Design, Analysis, Modeling, and Testing
Initialization-robust characterization of deep sub-electron read noise pixels via annealed PCH-EM
2025 · Hendrickson, Aaron J., Haefner, David P. · arXiv (Cornell University)
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A canonical model for behavior for an event-based camera detector
2025 · Stephen D. Burks, Aaron Hendrickson, et al. · Infrared Imaging Systems: Design, Analysis, Modeling, and Testing
Characterizing the ambiguity of event-based pixel temporal contrast encoding
2025 · Jonah P. Sengupta, David P. Haefner, et al. · Infrared Imaging Systems: Design, Analysis, Modeling, and Testing
Optimal use of data for PTC characterization of photon counting capable sensors
2024 · David P. Haefner, Aaron J. Hendrickson · Emerging Imaging and Sensing Technologies for Security and Defence
Per-pixel radiometric calibration to silux
2024 · David P. Haefner, Aaron Hendrickson, et al. · Infrared Imaging Systems: Design, Analysis, Modeling, and Testing
Developing new measurements through modeling and simulation: camera to display latency measurements
2024 · David P. Haefner, Aaron Hendrickson, et al. · Infrared Imaging Systems: Design, Analysis, Modeling, and Testing
Centralized inverse-Fano distribution for controlling conversion gain measurement accuracy of detector elements: erratum
2022 · Aaron J. Hendrickson · Journal of the Optical Society of America A
Exact and approximate solutions to the minimum of $1+x+\cdots+x^{2n}$
2021 · Hendrickson, Aaron, Leibovici, Claude F. · arXiv (Cornell University)
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Works count: 23
Citation count: 43
H-index: 4
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