Author

A. Smatri

Institution: Centre de Développement des Technologies Avancées

Observed institution: Centre de Développement des Technologies Avancées

OpenAlex ID: A5020438179

Oxide-trap based on charge pumping (OTCP) extraction method for irradiated MOSFET Devices:Part I (High frequencies)

2003 · B. Djezzar, S. Oussalah, et al. · IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) · 1

Works count: 1

Citation count: 1

H-index: 1

I10-index: