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Alessandro Veronesi

Observed names: A. Veronesi, Veronesi, Alessandro
ORCID: 0009-0000-1159-4463
Observed ORCID: 0009-0000-1159-4463
OpenAlex ID: A5020987415
An Ultra-Low Cost and Multicast-Enabled Asynchronous NoC for Neuromorphic Edge Computing
2024 · Zhe Su, Simone Ramini, et al. · IEEE Journal on Emerging and Selected Topics in Circuits and Systems · 21
Exploring Software Models for the Resilience Analysis of Deep Learning Accelerators: the NVDLA Case Study
2022 · A. Veronesi, F. Dall'Occo, et al. · IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) · 14
Cross-Layer Reliability Analysis of NVDLA Accelerators: Exploring the Configuration Space
2024 · Alessandro Veronesi, Alessandro Nazzari, et al. · IEEE European Test Symposium (ETS) · 12
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Reliability Assessment of Large DNN Models: Trading Off Performance and Accuracy
2024 · Junchao Chen, Giuseppe Esposito, et al. · IFIP/IEEE International Conference on Very Large Scale Integration · 9
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Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments
2025 · Nikoloas Chatzivangelis, Nikoloas Zazatis, et al. · Proceedings · 6
Prototyping Reconfigurable RRAM-Based AI Accelerators Using the RISC-V Ecosystem and Digital Twins
2023 · Markus Fritscher, Alessandro Veronesi, et al. · Lecture notes in computer science · 6
Cross-Layer Hardware/Software Assessment of the Open-Source NVDLA Configurable Deep Learning Accelerator
2020 · Alessandro Veronesi, Milos Krstic, et al. · IFIP/IEEE International Conference on Very Large Scale Integration · 5
EMBER: A Cycle-based Framework for Early-Stage Reliability Assessment in Parametric RTL Designs
2025 · Alessandro Veronesi, Leticia Maria Bolzani Pöhls, et al. · Proceedings - Asian Test Symposium/Proceedings · 2
AIDA4Edge: Twinning for Excellence in Adaptive Edge Artificial Intelligence
2025 · Marko Andjelkovic, Rizwan Tariq Syed, et al. · Euromicro Conference on Digital System Design (DSD) · 2
Resiliency in Digital Processing Systems
2023 · M. Krstić, M. Andjelković, et al. · IEEE International Conference on Microelectronics (MIEL) · 2
Cross-Layer Reliability Analysis of Slimmable Neural Networks under Permanent Faults
2026 · Nikolaos Zazatis, Alessandro Veronesi, et al. · IEEE VLSI Test Symposium (VTS) · 1
Assessing the Configuration Space of the Open Source NVDLA Deep Learning Accelerator on a Mainstream MPSoC Platform
2021 · Alessandro Veronesi, Davide Bertozzi, et al. · IFIP advances in information and communication technology · 1
Benchmarking Dataset Sampling Techniques for Reliability Analysis of Deep Neural Networks
2026 · Nikolaos Zazatis, Alessandro Veronesi, et al. · Proceedings
Early-Stage Reliability Assessment of Tensor-Based Deep Learning Accelerators
2026 · Robert Limas Sierra, Alessandro Veronesi, et al. · IEEE International On-Line Testing Symposium (IOLTS)
Special Session: Cross-Layer Reliability Analysis of Slimmable Neural Networks under Permanent Faults
2026 · Zazatis, Nikolaos Zazatis, Veronesi, Alessandro, et al. · Research Explorer (The University of Manchester)
Reliability Assessment of Deep Neural Networks and Accelerators Across Design Stages
2026 · Mohammad Hasan Ahmadilivani, Natalia Cherezova, et al. · IEEE Latin American Test Symposium (LATS)
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Yet another reliability assessment method for RRAM-based dot-product engine
2025 · Ahmed Mahmoudi, Alessandro Veronesi, et al. · Microelectronics Reliability
Works count: 18
Citation count: 81
H-index: 6
I10-index: 3
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