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Christian Miersch

Observed name: C. Miersch
ORCID: 0009-0006-7534-6649
Observed ORCID: 0009-0006-7534-6649
OpenAlex ID: A5021242401
AlGaN/GaN MISHEMTs with epitaxially grown GdScO3 as high- κ dielectric
2021 · Sarah Seidel, Alexander Schmid, et al. · Applied Physics Letters · 10
Morphological and electrical characterization of gate recessed AlGaN/GaN high electron mobility transistor device by purge-free atomic layer etching
2024 · Christian Miersch, Sarah Seidel, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 9
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Impact of Surface Treatment on Noise in PL Measurements of Silicon Vacancies in 4H-SiC Lateral PIN-Diodes
2026 · Jannik H. Schwarberg, Fabian Magerl, et al. · Nano Letters · 2
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On the way to more sustainability: Development of five Al0.25Ga0.75N atomic layer etching modes for shorter cycle times
2025 · Christian Miersch, Sarah Seidel, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2
Solid-State pH Sensors for Mine Water Monitoring
2020 · Frederic Güth, Franz Selbmann, et al. · ECS Meeting Abstracts · 2
Atomic Layer Etching of GaN and AlGaN Using CH4/H2, H2 and HCl Chemistry
2023 · Marco Radehaus, Stephan Wege, et al. · ECS Meeting Abstracts · 1
Applying atomic layer etching for enhanced SiC-based photonic devices
2026 · M. Siebert, T. Bi, et al. · Integrated Photonics Platforms
Impact of Inhomogeneous Offcut Angles of GaN Native Substrates on Lateral Current Modulation in AlGaN Barrier Layers
2025 · Sepideh Faraji, Elke Meissner, et al. · Crystal Research and Technology
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Morphological and Electrical Characterization of AlGaN/GaN Heterostructures Modified By Atomic Layer Etching
2023 · Christian Miersch, Stephan Wege, et al. · ECS Meeting Abstracts
Works count: 9
Citation count: 26
H-index: 2
I10-index: 1
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