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Franco Forlani
Observed name:
F. Forlani
Institution:
Associazione Italiana per la Ricerca Industriale
Observed institutions:
General Electric (United States),
Associazione Italiana per la Ricerca Industriale,
General Electric (Italy)
OpenAlex ID:
A5021395810
Thickness Influence in Breakdown Phenomena of Thin Dielectric Films
1964
·
F. Forlani
, N. Minnaja
·
physica status solidi (b)
·
138
Electrical Breakdown in Thin Dielectric Films
1969
·
Franco Forlani
, Nicola Minnaja
·
Journal of Vacuum Science and Technology
·
86
Electrical Conduction by Percolation in Thick Film Resistors
1976
·
F. Forlani
, M. Prudenziati
·
Active and Passive Electronic Components
·
48
PDF
Influence of the Metal Migration From Screen‐and‐Fired Terminationson the Electrical Characteristics of Thick‐Film Resistors
1977
·
A. Cattaneo
, M. Cocito
, et al.
·
Active and Passive Electronic Components
·
33
PDF
Low Cost Thick-Film Pressure Sensor
1980
·
A. Cattaneo
, R. Dell’Acqua
, et al.
·
SAE technical papers on CD-ROM/SAE technical paper series
·
16
Rectification by means of metal-dielectric-metal sandwiches
1964
·
F. Forlani
, N. Minnaja
·
Il Nuovo Cimento
·
11
Application of micromagnetics to a boundless plate
1968
·
F. Forlani
, N. Minnaja
, et al.
·
IEEE Transactions on Magnetics
·
9
Boron thermistors
1976
·
G.F. Cirri
, G. Fidanzati
, et al.
·
Thin Solid Films
·
8
Domain Pattern According to Micromagnetics
1969
·
F. Forlani
, N. Minnaja
·
Journal of Applied Physics
·
8
Characteristics and Performances of Thick Film Pressure Sensors for Automotive Applications
1982
·
Roberto Dell'Acqua
, Giuseppe Dell'Orto
, et al.
·
SAE technical papers on CD-ROM/SAE technical paper series
·
7
A proposal for a magneto-optical variable memory
1966
·
F. Forlani
, N. Minnaja
·
Proceedings of the IEEE
·
7
Theory of the Influence of Surface States on the Impedance of a Semiconductor‐Insulator Interface
1966
·
F. Forlani
, N. Minnaja
, et al.
·
physica status solidi (b)
·
5
Conduction Phenomena in Si‐SiO2‐Al Structures
1964
·
F. Forlani
, N. Minnaja
·
physica status solidi (b)
·
5
Photovoltaic Effect in Photoconductor‐Dielectric‐Metal Sandwiches
1965
·
F. Forlani
, N. Minnaja
·
physica status solidi (b)
·
4
Direct observation of lattice defects in silicon by means of transmission electron microscopy
1962
·
F. Forlani
, P. Gondi
·
Il Nuovo Cimento
·
4
The relative merits of thin film and thick film technology in microelectronics
1976
·
F. Forlani
·
Thin Solid Films
·
3
Remarks on the application of micromagnetics to a boundless plate
1968
·
A. Aharoni
, F. Forlani
, et al.
·
IEEE Transactions on Magnetics
·
3
Equivalent circuit of a metal-insulator-semiconductor structure
1967
·
F. Forlani
, N. Minnaja
, et al.
·
Solid-State Electronics
·
3
Electrical breakdown in ultrahigh vacuum
1966
·
G. Bacchin
, F. Forlani
, et al.
·
Il Nuovo cimento della Società italiana di fisica. B/Il Nuovo cimento B
·
3
Automotive Electronics: Where Are We Going?
1988
·
R. Dell'Acqua
, F. Forlani
·
Hybrid Circuits
·
2
A possible mechanism of memory switching in thin layers of chalcogenide glasses
1970
·
F. Forlani
, N. Minnaja
·
Thin Solid Films
·
2
Introductory remarks on gas sensing
1991
·
Franco Forlani
·
Sensors and Actuators B Chemical
·
1
Preparation and Properties of Pyrolitic Boron Thermistors
1976
·
Gianfranco Cirri
, Giovanni Fidanzati
, et al.
·
IEEE Transactions on Industrial Electronics and Control Instrumentation
·
1
Contribution to the study of metal contacts on semiconductor real surfaces
1967
·
F. Forlani
, N. Minnaja
, et al.
·
Electronics Letters
·
1
Note on the impedance of semiconductor surfaces in MOS structures
1965
·
F. Forlani
, N. Minnaja
, et al.
·
Proceedings of the IEEE
·
1
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Works count:
35
Citation count:
411
H-index:
8
I10-index:
6
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