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M. Elviretti
Observed names:
Elviretti, Matteo,
Matteo Elviretti
Institution:
Leibniz Institute for High Performance Microelectronics
Observed institutions:
University of Geneva,
European Organization for Nuclear Research,
Leibniz Institute for High Performance Microelectronics
ORCID:
0000-0002-6047-3040
Observed ORCID:
0000-0002-6047-3040
OpenAlex ID:
A5021479675
20 ps time resolution with a fully-efficient monolithic silicon pixel detector without internal gain layer
2023
·
S. Zambito
, M. Milanesio
, et al.
·
Journal of Instrumentation
·
12
PDF
Reliable metal–graphene contact formation process flows in a CMOS-compatible environment
2022
·
M. Elviretti
, M. Lisker
, et al.
·
Nanoscale Advances
·
9
PDF
SiGe-BiCMOS Technology with 500 GHz f T and 610 GHz f MAX
2025
·
H. Rücker
, B. Heinemann
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
7
Time resolution of a SiGe BiCMOS monolithic silicon pixel detector without internal gain layer with a femtosecond laser
2024
·
M. Milanesio
, L. Paolozzi
, et al.
·
Journal of Instrumentation
·
6
Radiation tolerance of SiGe BiCMOS monolithic silicon pixel detectors without internal gain layer
2024
·
M. Milanesio
, L. Paolozzi
, et al.
·
Journal of Instrumentation
·
3
Graphene Research in 200 mm CMOS Pilot Line
2022
·
M. Lukosius
, R. Lukose
, et al.
·
International Convention on Information and Communication Technology, Electronics and Microelectronics
·
3
Testbeam characterization of a SiGe BiCMOS monolithic silicon pixel detector with internal gain layer
2025
·
L. Paolozzi
, M. Milanesio
, et al.
·
Journal of Instrumentation
·
2
Testbeam results of irradiated SiGe BiCMOS monolithic silicon pixel detector without internal gain layer
2024
·
T. Moretti
, M. Milanesio
, et al.
·
Journal of Instrumentation
·
1
Varactors for Integrated RF Circuits in a 130 nm BiCMOS Technology
2025
·
Matteo Elviretti
, Andrea Malignaggi
, et al.
·
German Microwave Conference
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Works count:
10
Citation count:
43
H-index:
4
I10-index:
1
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