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Author

Marco Restifo

Observed names: M Restifo, M. Restifo
ORCID: 0000-0003-1729-7237
Observed ORCID: 0000-0003-1729-7237
OpenAlex ID: A5021663491
Scan chain encryption for the test, diagnosis and debug of secure circuits
2017 · Mathieu Da Silva, Marie-lise Flottes, et al. · IEEE European Test Symposium (ETS) · 37
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A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC
2017 · D. Appello, P. Bernardi, et al. · Design, Automation, and Test in Europe · 22
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test
2019 · F. Almeida, P. Bernardi, et al. · IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) · 17
Applicative System Level Test introduction to Increase Confidence on Screening Quality
2020 · P. Bernardi, M. Restifo, et al. · IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) · 14
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications
2018 · R. Cantoro, A. Firrincieli, et al. · IEEE Latin American Test Symposium (LATS) · 14
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An Optimized Test During Burn-In for Automotive SoC
2018 · Davide Appello, Conrad Bugeja, et al. · IEEE Design and Test · 14
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An evolutionary approach to hardware encryption and Trojan-horse mitigation
2017 · Andrea Marcelli, Marco Restifo, et al. · Design, Automation, and Test in Europe · 13
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller
2017 · P. Bernardi, R. Cantoro, et al. · IEEE Latin American Test Symposium (LATS) · 11
On-line software-based self-test for ECC of embedded RAM memories
2017 · M. Restifo, P. Bernardi, et al. · Proceedings · 5
On the in-field test of embedded memories
2017 · P. Bernardi, M. Restifo, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 3
Late Breaking Results: Uncovering the Limits of ECCs in Vision Transformers and a Zero-Cost Reliability Enhancement
2026 · Mohammad Hasan Ahmadilivani, Marten Roots, et al. · Design, Automation, and Test in Europe · 2
A Hybrid In-Field Self-Test Technique for SoCs
2019 · S. Carbonara, P. Bernardi, et al. · International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) · 2
Effective and Memory-Efficient Alternatives to ECC for Reliable Large-Scale DNNs
2026 · Mohammad Hasan Ahmadilivani, Marten Roots, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 1
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In
2018 · Davide Appello, Paolo Bernardi, et al. · Journal of Low Power Electronics · 1
Reliability and Testing of Complex Safety-Critical Automotive SoC
2020 · Marco Restifo · PORTO@Iris
スクリーニング品質の信頼性を高めるための応用システムレベルテスト導入【jst・京大機械翻訳】
2020 · P Bernardi, M Restifo, et al. · IEEE Conference Proceedings
Self-testing of multicore processors
2019 · Michael A. Skitsas, Marco Restifo, et al. · Institution of Engineering and Technology eBooks
Innovative Practices on Automotive Test
2019 · Wim Dobbelaere, Marco Restifo, et al. · IEEE VLSI Test Symposium (VTS)
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC
2018 · Davide Appello, Paolo Bernardi, et al. · Journal of Electronic Testing
Defeating Hardware Trojan through Software Obfuscation
2017 · Andrea Marcelli, Marco Restifo, et al. · PORTO@Iris
Works count: 20
Citation count: 156
H-index: 8
I10-index: 8
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