Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Dewen Zhao
Observed names:
D. Zhao,
D.P. Zhao,
DeWen Zhao,
Dewen ZHAO
Institutions:
State Key Laboratory of Tribology,
Tsinghua University
Observed institutions:
Harbin Engineering University,
Shandong University,
Lam Research (United States),
State Key Laboratory of Tribology,
University of Edinburgh,
Tsinghua University
show all 6
ORCID:
0000-0002-7622-9296
Observed ORCID:
0000-0002-7622-9296
OpenAlex ID:
A5021955006
Chemical mechanical polishing: Theory and experiment
2013
·
Dewen Zhao
, Xinchun Lu
·
Friction
·
256
PDF
The material removal and surface generation mechanism in ultra-precision grinding of silicon wafers
2022
·
Hongfei Tao
, Yuanhang Liu
, et al.
·
International Journal of Mechanical Sciences
·
62
Prediction and measurement for grinding force in wafer self-rotational grinding
2023
·
Hongfei Tao
, Yuanhang Liu
, et al.
·
International Journal of Mechanical Sciences
·
58
Ductile deformation and subsurface damage evolution mechanism of silicon wafer induced by ultra-precision grinding process
2023
·
Hongfei Tao
, Yuanhang Liu
, et al.
·
Tribology International
·
54
Fabrication of Flexible and Transparent Metal Mesh Electrodes Using Surface Energy‐Directed Assembly Process for Touch Screen Panels and Heaters
2023
·
Siqing Yuan
, Zebin Fan
, et al.
·
Advanced Science
·
44
PDF
Effects of grinding-induced surface topography on the material removal mechanism of silicon chemical mechanical polishing
2023
·
Hongfei Tao
, Qinyang Zeng
, et al.
·
Applied Surface Science
·
42
Undeformed chip width non-uniformity modeling and surface roughness prediction in wafer self-rotational grinding process
2022
·
Hongfei Tao
, Yuanhang Liu
, et al.
·
Tribology International
·
41
Kinematic Optimization for Chemical Mechanical Polishing Based On Statistical Analysis of Particle Trajectories
2013
·
Dewen Zhao
, Tongqing Wang
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
41
In-situ measurement of Cu film thickness during the CMP process by using eddy current method alone
2013
·
Zilian Qu
, Qian Zhao
, et al.
·
Microelectronic Engineering
·
40
Cutting speed dependence of material removal mechanism for monocrystal silicon
2023
·
Hongfei Tao
, Yuanhang Liu
, et al.
·
International Journal of Mechanical Sciences
·
37
Influence of anisotropy on material removal and deformation mechanism based on nanoscratch tests of monocrystal silicon
2023
·
Hongfei Tao
, Qinyang Zeng
, et al.
·
Tribology International
·
36
Anchoring Ni atomic clusters on yolk-shell In2O3 microspheres for highly sensitive, ultra-rapid responding/recovering ppb-level NO2 detections
2024
·
Zhidong Jin
, Yue Mou
, et al.
·
Chemical Engineering Journal
·
29
Effects of wheel spindle vibration on surface formation in wafer self-rotational grinding process
2022
·
Hongfei Tao
, Yuanhang Liu
, et al.
·
International Journal of Mechanical Sciences
·
29
An Investigation on the Total Thickness Variation Control and Optimization in the Wafer Backside Grinding Process
2022
·
Yuanhang Liu
, Hongfei Tao
, et al.
·
Materials
·
26
PDF
Flatness maintenance and roughness reduction of silicon mirror in chemical mechanical polishing process
2019
·
BoCheng Jiang
, DeWen Zhao
, et al.
·
Science China Technological Sciences
·
26
Effect of zone pressure on wafer bending and fluid lubrication behavior during multi-zone CMP process
2013
·
Dewen Zhao
, Tongqing Wang
, et al.
·
Microelectronic Engineering
·
26
Effect of Kinematic Parameters and Their Coupling Relationships on Global Uniformity of Chemical-Mechanical Polishing
2012
·
Dewen Zhao
, Yongyong He
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
26
Strategies of realizing NO2 detections with enhanced selectivity and anti-humidity based on snowflake-like in-situ grown ZIF-8/ZnOHF composites
2024
·
Zhidong Jin
, Jinbo Zhao
, et al.
·
Sensors and Actuators B Chemical
·
24
Humidity-independent NO2 gas sensors based on ZnO-NiOFx nanocomposites and the synergistic humidity-immune effect of fluorine doped NiO
2024
·
Zhidong Jin
, Yue Mou
, et al.
·
Journal of Power Sources
·
23
Numerical investigation of wafer drying induced by the thermal Marangoni effect
2018
·
Changkun Li
, Dewen Zhao
, et al.
·
International Journal of Heat and Mass Transfer
·
22
Evolution of entrained water film thickness and dynamics of Marangoni flow in Marangoni drying
2018
·
Changkun Li
, Dewen Zhao
, et al.
·
RSC Advances
·
20
PDF
Optimization of design of experiment for chemical mechanical polishing of a 12-inch wafer
2013
·
Tongqing Wang
, Xinchun Lu
, et al.
·
Microelectronic Engineering
·
20
Process Control in Semiconductor Manufacturing Based on Deep Distributional Soft Actor-Critic Reinforcement Learning
2025
·
Bangxu Liu
, Dewen Zhao
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
18
Effect of slurry injection position on material removal in chemical mechanical planarization
2013
·
Tongqing Wang
, Dewen Zhao
, et al.
·
The International Journal of Advanced Manufacturing Technology
·
18
Assessment of Physics-Based and Data-Driven Models for Material Removal Rate Prediction in Chemical Mechanical Polishing
2018
·
Xuan Li
, Cheng Wang
, et al.
·
16
PDF
Show more works
View as search
Works count:
70
Citation count:
1,299
H-index:
20
I10-index:
36
Year
Topic
Type