Author

Ken B. Greiner

Observed names: K. Greiner, K.B. Greiner, Ken Greiner
Observed institution: Microcosm (United States)
OpenAlex ID: A5021962869
2001 · Sebastian Böhm, Ken Greiner, et al. · Springer eBooks · 41
2015 · Louis Gerrer, Andrew R. Brown, et al. · IEEE Transactions on Electron Devices · 28
2004 · Tom Korsmeyer, Jun Zeng, et al. · ACM/IEEE Design Automation Conference (DAC) · 17
2002 · Yao-Joe Yang, M. Kamon, et al. · IEEE International Conference on Micro Electro Mechanical Systems (MEMS) · 16
1999 · L. Bousse, A. Minalla, et al. · IEEE International Conference on Micro Electro Mechanical Systems (MEMS) · 12
2000 · Jun Zeng, Manish Deshpande, et al. · ASME International Mechanical Engineering Congress and Exposition (IMECE) · 10
2001 · Jao-Joe Yang, Mattan Kamon, et al. · Elsevier eBooks · 8
2000 · Ken B. Greiner, Manish Deshpande, et al. · Springer eBooks · 7
2000 · Manish Deshpande, Ken B. Greiner, et al. · Springer eBooks · 6
2016 · Jiangjiang (Jimmy) Gu, Dalong Zhao, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2014 · D. Fried, K. Greiner, et al. · International Conference on Simulation of Semiconductor Processes and Devices · 5
2013 · B. Cipriany, B. Jagannathan, et al. · International Conference on Simulation of Semiconductor Processes and Devices · 4
2016 · Mattan Kamon, Mustafa Akbulut, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2000 · M. Deshpande, K.B. Greiner, et al. · Solid-State Sensors, Actuators, and Microsystems Workshop (Hilton Head Workshop) · 2
2017 · Mustafa B. Akbulut, Jiangjiang Gu, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
2000 · B. Romanowicz, Mohd Hairi Mohd Zaman, et al. · Computer Modeling in Engineering & Sciences · 1
2017 · S. Guissi, W. F. Clark, et al. · IEEE International Interconnect Technology Conference (IITC)
2016 · Mattan Kamon, Mustafa B. Akbulut, et al. · Journal of Micro/Nanopatterning Materials and Metrology
2016 · Mark I. Gardner, Jim Fulford, et al. · IEEE Workshop on Microelectronics and Electron Devices (WMED)
2000 · Y.-J. Yang, M. Kamon, et al. · Solid-State Sensors, Actuators, and Microsystems Workshop (Hilton Head Workshop)
1999 · Mark G. da Silva, Ken Greiner, et al. · ASME International Mechanical Engineering Congress and Exposition (IMECE)
1999 · M Deshpande, Jayne Gilbert, et al. · TechConnect Briefs
1998 · Ken Greiner · Library and Archives Canada (Government of Canada)
Works count: 24
Citation count: 166
H-index: 7
I10-index: 6
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