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Gilson Inácio Wirth

Observed names: G Wirth, G. I. Wirth, G. Wirth, G.I. Wirth, GILSON INACIO WIRTH, Gilson I Wirth, Gilson I. Wirth, Gilson Inacio Wirth, Gilson Incio Wirth, Gilson In´acio Wirth, Gilson Wirth, Wirth, G., Wirth, Gilson, Wirth, Gilson Inácio
Observed institutions: Universidade Federal do Rio Grande, Universidade Federal do Rio Grande do Sul, Universidade Federal de Pelotas, TU Dortmund University, Vanderbilt University, Universidade Federal de Santa Maria, Universidade Estadual do Rio Grande do Sul
ORCID: 0000-0002-4990-5113
Observed ORCID: 0000-0002-4990-5113
OpenAlex ID: A5022015482
Atomistic approach to variability of bias-temperature instability in circuit simulations
2011 · B. Kaczer, S. Mahato, et al. · IEEE International Reliability Physics Symposium proceedings · 130
Using Bulk Built-in Current Sensors to Detect Soft Errors
2006 · E.H. Neto, I. Ribeiro, et al. · IEEE Micro · 122
Modeling of Statistical Low-Frequency Noise of Deep-Submicrometer MOSFETs
2005 · G.I. Wirth, J. Koh, et al. · IEEE Transactions on Electron Devices · 90
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Statistical Model for MOSFET Bias Temperature Instability Component Due to Charge Trapping
2011 · Gilson I. Wirth, Roberto da Silva, et al. · IEEE Transactions on Electron Devices · 87
Single Event Transients in Logic Circuits—Load and Propagation Induced Pulse Broadening
2008 · Gilson Wirth, Fernanda L Kastensmidt, et al. · IEEE Transactions on Nuclear Science · 83
Compact Modeling of Statistical BTI Under Trapping/Detrapping
2013 · Jyothi Bhaskarr Velamala, Ketul B. Sutaria, et al. · IEEE Transactions on Electron Devices · 78
Response of a single trap to AC negative Bias Temperature stress
2011 · M. Toledano-Luque, B. Kaczer, et al. · IEEE International Reliability Physics Symposium proceedings · 72
Sub 1 V CMOS bandgap reference design techniques: a survey
2009 · Christian Jésus B. Fayomi, Gilson I. Wirth, et al. · Analog Integrated Circuits and Signal Processing · 67
Circuit Design for Reliability
2014 · Reis, Ricardo, Cao, Yu, et al. · Springer eBooks · 59
Accurate and computer efficient modelling of single event transients in CMOS circuits
2007 · G.I. Wirth, M.G. Vieira, et al. · IET Circuits Devices & Systems · 55
ZnO nanoparticle thin-film transistors on flexible substrate using spray-coating technique
2016 · Fábio F. Vidor, Thorsten Meyers, et al. · Microelectronic Engineering · 46
Hardware implementation of a true random number generator integrating a hexagonal boron nitride memristor with a commercial microcontroller
2022 · Sebastian Pazos, Wenwen Zheng, et al. · Nanoscale · 40
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A Physics-Based Statistical RTN Model for the Low Frequency Noise in MOSFETs
2016 · Mauricio Banaszeski da Silva, Hans P. Tuinhout, et al. · IEEE Transactions on Electron Devices · 40
Modeling the sensitivity of CMOS circuits to radiation induced single event transients
2007 · Gilson I. Wirth, Michele G. Vieira, et al. · Microelectronics Reliability · 38
High‐Temporal‐Resolution Characterization Reveals Outstanding Random Telegraph Noise and the Origin of Dielectric Breakdown in h‐BN Memristors
2023 · Sebastian Pazos, Thales Becker, et al. · Advanced Functional Materials · 35
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Logarithmic behavior of the degradation dynamics of metal–oxide–semiconductor devices
2010 · Roberto da Silva, Gilson I Wirth · Journal of Statistical Mechanics Theory and Experiment · 30
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Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics
2014 · F.F. Vidor, G.I. Wirth, et al. · Microelectronics Reliability · 28
Simulation Evaluation of an Implemented Set of Complementary Bulk Built-In Current Sensors With Dynamic Storage Cell
2013 · Alexandre Simionovski, Gilson Wirth · IEEE Transactions on Device and Materials Reliability · 28
TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation
2011 · Fernanda Lima Kastensmidt, Evaldo Carlos Pereira Fonseca, et al. · IEEE Transactions on Nuclear Science · 28
Tbulk-BICS: A Built-In Current Sensor Robust to Process and Temperature Variations for Soft Error Detection
2008 · Egas Henes Neto, Fernanda Lima Kastensmidt, et al. · IEEE Transactions on Nuclear Science · 28
Statistical Model for the Circuit Bandwidth Dependence of Low-Frequency Noise in Deep-Submicrometer MOSFETs
2007 · Gilson I. Wirth, Roberto da Silva, et al. · IEEE Transactions on Electron Devices · 24
A physics-based RTN variability model for MOSFETs
2014 · Mauricio Banaszeski da Silva, Hans Tuinhout, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 23
Statistical model for MOSFET low-frequency noise under cyclo-stationary conditions
2009 · Gilson Wirth, Roberto da Silva, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 23
Modeling and simulation of the charge trapping component of BTI and RTS
2017 · Thiago Hanna Both, Gabriela Firpo Furtado, et al. · Microelectronics Reliability · 22
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs
2014 · F.L. Kastensmidt, J. Tonfat, et al. · Microelectronics Reliability · 22
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Works count: 220
Citation count: 2,278
H-index: 23
I10-index: 64
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