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Kai-Hsin Chuang

Observed names: K. Chuang, K. H. Chuang, K.-H. Chuang, Kent Kai-Hsin Chuang
ORCID: 0000-0002-5834-2324
Observed ORCID: 0000-0002-5834-2324
OpenAlex ID: A5022313643
A Physically Unclonable Function Using Soft Oxide Breakdown Featuring 0% Native BER and 51.8 fJ/bit in 40-nm CMOS
2019 · Kai-Hsin Chuang, Erik Bury, et al. · IEEE Journal of Solid-State Circuits · 95
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Physically unclonable function using CMOS breakdown position
2017 · K.-H. Chuang, E. Bury, et al. · IEEE International Reliability Physics Symposium proceedings · 25
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Self-heating-aware CMOS reliability characterization using degradation maps
2018 · E. Bury, A. Chasin, et al. · IEEE International Reliability Physics Symposium proceedings · 23
Statistical assessment of the full VG/VD degradation space using dedicated device arrays
2017 · E. Bury, B. Kaczer, et al. · IEEE International Reliability Physics Symposium proceedings · 22
X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices
2018 · P. F. Wang, E. X. Zhang, et al. · IEEE Transactions on Nuclear Science · 20
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A multi-bit/cell PUF using analog breakdown positions in CMOS
2018 · K.-H. Chuang, E. Bury, et al. · IEEE International Reliability Physics Symposium proceedings · 19
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The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation
2020 · Michiel Vandemaele, Kai-Hsin Chuang, et al. · IEEE International Reliability Physics Symposium proceedings · 17
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Quantum Tunneling PUF: A Chip Fingerprint for Hardware Security
2021 · Kent Kai-Hsin Chuang, Hsin-Ming Chen, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 11
Design of 24GHz CMOS VCO using armstrong topology with asymmetric transformer
2014 · Pingyi Wang, Y. Shen, et al. · Asia-Pacific Microwave Conference (APMC) · 8
A fully integrated Ku-band down-converter front-end for DBS receivers
2014 · Ping-Yi Wang, Min-Chih Chou, et al. · IEEE MTT-S International Microwave Symposium digest · 8
New Adaptive Template Attacks Against Montgomery-Ladder-Based ECCs in IoT Devices
2024 · Chun-Heng You, Chih-Hao Chiang, et al. · IEEE Internet of Things Journal · 7
A Cautionary Note When Looking for a Truly Reconfigurable Resistive RAM PUF
2018 · Kai-Hsin Chuang, Robin Degraeve, et al. · IACR Transactions on Cryptographic Hardware and Embedded Systems · 7
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A Physically Unclonable Function with 0% BER Using Soft Oxide Breakdown in 40nm CMOS
2018 · Kai-Hsin Chuang, Erik Bury, et al. · IEEE Asian Solid-State Circuits Conference (A-SSCC) · 6
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A low phase-noise 24GHz CMOS quadrature-VCO using PMOS-source-follower coupling technique
2014 · Ping-Yi Wang, Yin-Cheng Chang, et al. · European Microwave Conference (EuMC) · 6
(Invited) Recent insights in CMOS reliability characterization by the use of degradation maps
2018 · E. Bury, A. Chasin, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 2
Security and reliability – friend or foe
2019 · I. Verbauwhede, K.-H. Chuang · Technical digest - International Electron Devices Meeting/Technical digest · 1
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Physically Unclonable Function Using Cmos Breakdown Position
2017 · Kai-Hsin Chuang, Bury, Erik, et al. · Zenodo (CERN European Organization for Nuclear Research)
Works count: 17
Citation count: 277
H-index: 8
I10-index: 8
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