2010 · F. Jabeen, M. Piccin, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 16

On the growth of InAs nanowires by molecular beam epitaxy

2010 · Faustino Martelli, Silvia Rubini, et al. · Journal of Crystal Growth · 14

An aluminum‐germanium eutectic structure for silicon wafer bonding technology

2005 · I. Perez‐Quintana, G. Ottaviani, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 12

In-plane band gap modulation investigated by secondary electron imaging of GaAsN/GaAsN:H heterostructures

2008 · L. Felisari, V. Grillo, et al. · Applied Physics Letters · 9

Effects of thermal annealing on the structural properties of sputtered W–Si–N diffusion barriers

2004 · Alberto Vomiero, Enrico Boscolo Marchi, et al. · Materials Science in Semiconductor Processing · 9

Quantum confinement effects in hydrogen-intercalated Ga1−xAsxNx-GaAs1−xNx:H planar heterostructures investigated by photoluminescence spectroscopy

2010 · R. Trotta, L. Cavigli, et al. · Physical Review B · 8

Structural properties of reactively sputtered W–Si–N thin films

2007 · A. Vomiero, E. Boscolo Marchi, et al. · Journal of Applied Physics · 8

Transmission electron microscopy study of blisters in high-temperature annealed He and H co-implanted single-crystal silicon

2004 · S. Frabboni, G. C. Gazzadi, et al. · Applied Physics Letters · 8

Oxidation of Supported PtRh Particles: Size and Morphology Effects

2010 · M. Dalmiglio, M. Amati, et al. · The Journal of Physical Chemistry C · 7

Surface Memory in Nickel HER Catalysts: Hydroxide Formation at Open-Circuit Potential

2026 · Eleanor Ender, Yifeng Wang, et al. · ACS Catalysis · 4

Structural and functional characterization of W-Si-N sputtered thin films for copper metallizations

2004 · Alberto Vomiero, Stefano Frabboni, et al. · MRS Proceedings · 4

Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis

2011 · L. Felisari, V. Grillo, et al. · Ultramicroscopy · 3

Z-contrast STEM 3D Information by Abel transform in Systems with Rotational Symmetry

2008 · V Grillo, E Carlino, et al. · Springer proceedings in physics · 1

Structural and electrical investigation of high temperature annealed As-implanted Si crystals

2005 · C. Bocchi, L. Felisari, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1

A Comparative TEM Study of Soot Particles Derived from Used Diesel and Gasoline Engine Oils

2017 · Arne Janssen, Laura Felisari, et al. · Microscopy and Microanalysis

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Nanomodules and Light Trapping Systems for High Voltage Organic Solar Cells

2010 · Sovernigo, E., Dal Zilio, S., et al. · EU PVSEC

Works count: 28

Citation count: 784

H-index: 12

I10-index: 12