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Author

О. К. Гусев

Observed names: O. Gusev, O. K. Gusev, Oleg Gusev, Гусев О. К., Гусев, О. К.
ORCID: 0000-0001-5180-1121
Observed ORCID: 0000-0001-5180-1121
OpenAlex ID: A5023423130
Surface Electric Potential Measurement with a Static Probe
2023 · R. I. Vorobey, O. K. Gusev, et al. · Devices and Methods of Measurements · 5
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Influence of Rapid Thermal Treatment of Initial Silicon Wafers on the Electrophysical Properties of Silicon Dioxide Obtained by Pyrogenous Oxidation
2019 · Vladimir A. Pilipenko, Vitaly A. Solodukha, et al. · High Temperature Material Processes An International Quarterly of High-Technology Plasma Processes · 5
Characterization of the Electrophysical Properties of Silicon-silicon Dioxide Interface Using Probe Electrometry Methods
2017 · V. А. Pilipenko, V. A. Saladukha, et al. · Devices and Methods of Measurements · 4
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Analysis of the Electrophysical and Photoelectric Properties of Nanocomposite Polymers by the Modified Kelvin Probe
2017 · K. U. Pantsialeyeu, A. U. Krautsevich, et al. · Devices and Methods of Measurements · 3
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Kelvin probe error compensation based on harmonic analysis of measurement signal
2014 · A. K. Tyavlovsky, А. Л. Жарин, et al. · Electronic scientific archive of UrFU (Ural Federal University) · 3
Photoelectric semiconductor converters with a large dynamic range
2014 · R. I. Vorobey, О. К. Гусев, et al. · Electronic scientific archive of UrFU (Ural Federal University) · 3
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Digital Contact Potential Probe in Studying the Deformation of Dielectric Materials
2020 · Kanstantsin Pantsialeyeu, Anatoly Zharin, et al. · Informatyka Automatyka Pomiary w Gospodarce i Ochronie Środowiska · 2
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Анализ распределения электрофизических и фотоэлектрических свойств нанокомпозитных полимеров модифицированным зондом Кельвина
2017 · К. В. Пантелеев, А. В. Кравцевич, et al. · Electronic scientific archive of UrFU (Ural Federal University) · 2
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Analysis of Surface Defects of Aluminum and Its Alloys With a Scanning Kelvin Probe
2017 · A. K. Tyavlovsky, A. L. Zharin, et al. · Devices and Methods of Measurements · 2
Kelvin Probe's Stray Capacitance and Noise Simulation
2014 · S. Danyluk, А. В. Дубаневич, et al. · Electronic scientific archive of UrFU (Ural Federal University) · 2
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X-ray Diffraction Method in the Study of a Metal Surface Stress State Under Static and Impact Deformation
2023 · A. P. Kren, M. N. Delendik, et al. · Devices and Methods of Measurements · 1
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Charge-Sensitive Technique for Deformation Processes’ Study
2022 · K. U. Pantsialeyeu, U. A. Mikitsevich, et al. · Devices and Methods of Measurements · 1
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Semiconductor Wafers Testing Based on Electron Work Function of Surface
2020 · К. В. Пантелеев, А. Л. Жарин, et al. · 1
Measuring transducers for optical diagnostic system with multifunctional unitary photovoltaic converters
2018 · R. I. Vorobei, O. K. Gusev, et al. · Devices and Methods of Measurements · 1
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Study of Silicon-insulator Structure Defects Based on Analysis of a Spatial Distribution of a Semiconductor Wafers’ Surface Potential
2015 · R. I. Vorobey, O. K. Gusev, et al. · Instruments and Methods of Measurement (Belarusian National Technical University) · 1
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UIM-1 Measuring Complex for Comprehensive Evaluation of Mechanical Properties of Materials by Instrumented Indentation
2026 · К. Pantsialeyeu, A. Kren, et al. · Devices and Methods of Measurements
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Series of Photovoltaic Converters Based on Semiconductors with Intrinsic Photoconductivity
2021 · R. I. Vorobey, O. K. Gusev, et al. · Devices and Methods of Measurements
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Системы регулирования и управления освещением
2020 · К. В. Пантелеев, А. В. Самарина, et al. · БНТУ eBooks
Непрерывная система образования "Школа - университет". Инновации и перспективы
2018 · О. К. Гусев, Н. П. Воронова, et al. · Electronic scientific archive of UrFU (Ural Federal University)
Проектирование систем охранного телевидения
2016 · К. Л. Тявловский, Р. И. Воробей, et al. · Electronic scientific archive of UrFU (Ural Federal University)
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Metrological Performance Modeling of Probe Electrometers Capacitive Sensors
2015 · A. K. Tyavlovsky, O. K. Gusev, et al. · Instruments and Methods of Measurement (Belarusian National Technical University)
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Kelvin Probe Self-calibration Mode for Semiconductor Wafers Properties Monitoring
2015 · R. I. Vorobey, O. K. Gusev, et al. · DOAJ (DOAJ: Directory of Open Access Journals)
Режим Самокалибровки Зонда Кельвина Для Контроля Электрофизических Параметров Полупроводниковых Пластин
2014 · Р. И. Воробей, О. К. Гусев, et al. · Electronic scientific archive of UrFU (Ural Federal University)
Методика неразрушающего контроля качества наноструктурированных покрытий на основе анализа распределения РВЭ
2014 · Р. И. Воробей, О. К. Гусев, et al. · Electronic scientific archive of UrFU (Ural Federal University)
Designing and controlling the metrological parameters of photoelectric transducers based on semiconductors with multiply-charged dopants
2013 · O. K. Gusev, A. I. Svistun, et al. · Automation and Remote Control
Works count: 51
Citation count: 36
H-index: 3
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