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Author

Dongseok Oh

Observed name: Dong-Seok Oh
Institution: Sogang University
ORCID: 0009-0005-1297-0498
Observed ORCIDs: 0009-0005-1297-0498, 0009-0002-5604-5753
OpenAlex ID: A5023655415
Unveiling the origin of n-type doping of natural MoS2: carbon
2023 · Youngsin Park, Nannan Li, et al. · npj 2D Materials and Applications · 56
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Enhancement of photosensitivity and stability of Sn-12 EUV resist by integrating photoactive nitrate anion
2024 · Yeo Kyung Kang, Heeju Kim, et al. · Applied Surface Science · 29
Wafer-Scale Programmed Assembly of One-Atom-Thick Crystals
2022 · Seong-Jun Yang, Ju-Hyun Jung, et al. · Nano Letters · 27
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Optimization of Cross-Bridge Kelvin Resistor (CBKR) Layout for the Precise Contact Resistance Measurement of TiSi2/n+ Si
2025 · Hyungju Noh, Changmin Chae, et al. · Electronics · 1
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Mitigation of the Row-Hammer Effect in Sub-20 nm Dynamic Random-Access Memory (DRAM) Using Low-k Dielectrics
2026 · Jeongbeen Park, Dongseok Oh, et al. · Microelectronics
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EUV sensitivity and PEB stability of Sn-12 clusters for EUVL
2024 · Yeo Kyung Kang, Heeju Kim, et al. · Advances in Patterning Materials and Processes
Electronic Structures of Two-Dimensional Materials
2019 · Daesung Jung, Dongseok Oh, et al. · Journal of Surface Analysis
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Works count: 7
Citation count: 113
H-index: 3
I10-index: 3
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