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Deepak Kumar Sharma

Electrical transport and low-frequency noise in chemical vapor deposited single-layer MoS2 devices
2014 · Deepak Sharma, Matin Amani, et al. · Nanotechnology · 56
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Transfer characteristics and low-frequency noise in single- and multi-layer MoS2 field-effect transistors
2015 · Deepak Sharma, Abhishek Motayed, et al. · Applied Physics Letters · 32
Detection of Deep-Levels in Doped Silicon Nanowires Using Low-Frequency Noise Spectroscopy
2013 · Deepak Sharma, Abhishek Motayed, et al. · IEEE Transactions on Electron Devices · 21
Effect of electrical stress on Au/Pb (Zr0.52Ti0.48) O3/TiOxNy/Si gate stack for reliability analysis of ferroelectric field effect transistors
2014 · Robin Khosla, Deepak K. Sharma, et al. · Applied Physics Letters · 17
Multilevel metal/Pb(Zr0.52Ti0.48)O3/TiOxNy/Si for next generation FeRAM technology node
2015 · Deepak K. Sharma, Robin Khosla, et al. · Solid-State Electronics · 15
Rate limited filament formation in Al-ZnO-Al bipolar ReRAM cells and its impact on early current window closure during cycling
2019 · Amit Kumar Singh Chauhan, Deepak K. Sharma, et al. · Journal of Applied Physics · 5
In situ piezo-magneto coupling enabled PVDF based nanogenerator for concurrent mechanical and magnetic energy harvesting
2026 · Chetna, Mukul Kumar, et al. · Materials Research Bulletin · 3
Impact of Varying Strain Energy in Oxide on Random Telegraph Noise and Associated Time Constants in Silicon Nanowire pMOSFETs
2019 · Deepak Kumar Sharma, Arnab Datta · IEEE Transactions on Electron Devices · 3
Mitigating Voltage Fluctuations in Grid-Tied PV Systems: Power Quality Enhancement
2024 · Sheena Tahira Khan, Vilas Ramrao Joshi, et al. · International Conference on Computational Modelling, Simulation and Optimization (ICCMSO) · 2
Multiscale Modeling of Self-Heating-Induced and Deformation-Accelerated Dielectric Traps Impacting Critical Path of Dielectric Breakdown in 5-nm Stacked Nanosheet FET
2025 · Vivek Kumar, Deepak Kumar Sharma, et al. · IEEE Transactions on Electron Devices · 1
Impact of heavy ions on a-Si:H/PolySi bilayer thin film transistors with Schottky barrier source and drain based on Nickel Silicide
2023 · Deepak K. Sharma, Vivek Kumar · Memories - Materials Devices Circuits and Systems · 1
Oxide Edge Trap Density Extraction in Silicon Nanowire MOSFET From Tunnel Current Noise Measurement in Gated Diode Like Arrangement
2020 · Deepak Kumar Sharma, Arnab Datta · IEEE Transactions on Device and Materials Reliability · 1
Field Stress Influenced Conduction Behavior of Narrow Diameter Gate-All-Around (GAA) Silicon Nanowire n-MOSFET
2019 · Deepak K. Sharma, Ranjith Kumar Goud, et al. · Journal of Electronic Materials · 1
Spatially Uncorrelated Quad‐Port MIMO DRA With Negative Refractive Index Surface
2026 · Gourab Das, Deepak Kumar Sharma, et al. · International Journal of Numerical Modelling Electronic Networks Devices and Fields
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Energy Efficient Single Phase Adiabatic Logic and Its Application in Ripple Carry Adder Design
2025 · Jitendra Kanungo, Jitendra Raghuwanshi, et al. · Circuits Systems and Signal Processing
Semiconductor-to-metal phase change in MoTe2 layers (Conference Presentation)
2016 · Albert V. Davydov, Sergiy Krylyuk, et al. · Low-Dimensional Materials and Devices
High performance Au/PZT/TiOxNy/Si MFIS structure for next generation ferroelectric memory applications
2015 · Deepak K. Sharma, Robin Khosla, et al. · AIP conference proceedings
Electronic Transport and Low Frequency Noise Characterization in Si Nanowire and 2-dimensional MoS2 based Field-effect Transistors
2014 · Sharma, Deepak K.
Cross-spectrum noise spectroscopy for characterization of deep-levels in nanoscale devices
2013 · Deepak K. Sharma, Sergiy Krylyuk, et al. · Bulletin of the American Physical Society
Works count: 19
Citation count: 158
H-index: 5
I10-index: 5
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