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Gilbert U. Singco
Observed names:
G. Singco,
G. U. Singco,
G.U. Singco,
Gilbert Singco
Institutions:
IBM (United States),
IBM Research - Thomas J. Watson Research Center,
Toshiba (United States)
Observed institutions:
IBM (United States),
IBM Research - Thomas J. Watson Research Center,
Toshiba (United States)
OpenAlex ID:
A5024239201
Three-dimensional integrated circuits
2006
·
A. W. Topol
, D. C. La Tulipe
, et al.
·
IBM Journal of Research and Development
·
703
Extendibility of NiPt Silicide Contacts for CMOS Technology Demonstrated to the 22-nm Node
2007
·
Kazuya Ohuchi
, Christian Lavoie
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
20
Poly-Si/AlN/HfSiO Stack for Ideal Threshold Voltage and Mobility in Sub-100 nm MOSFETs
2006
·
K. Lee
, M. Frank
, et al.
·
Symposium on VLSI Technology
·
17
Solid state amorphization of RE-TM (RE = Ce, Er and TM = Fe, Co) multilayers
1991
·
M. Matsuura
, R. Petkie
, et al.
·
Materials Science and Engineering A
·
12
Effect of Ag on the surface barrier for depletion of oxygen from polycrystalline Y Ba2 Cu3 O7 oxides
1989
·
A. G. Schrott
, K. N. Tu
, et al.
·
Physical review. B, Condensed matter
·
9
Surface segregation of Ba in polycrystalline YBa2Cu3O7 oxides: The effect of silver
1989
·
A. G. Schrott
, G. Singco
, et al.
·
Applied Physics Letters
·
8
Extendibility of NiPt silicide to the 22-nm node CMOS technology
2008
·
Kazuya Ohuchi
, Christian Lavoie
, et al.
·
International Workshop on Junction Technology
·
6
Crystallization of amorphous CoSi2 thin films I. kinetics of nucleation and growth
1994
·
J.M. Liang
, L.J. Chen
, et al.
·
Materials Chemistry and Physics
·
6
Electrical transport properties of CoSi2 and Co(SixGe1−x)2 films formed by different methods
1991
·
Bing-Zong Li
, P. Liu
, et al.
·
Journal of Applied Physics
·
3
Silicon detector for low-energy electron spectroscopy
1990
·
K. Daneshvar
, R. G. Aitken
, et al.
·
Review of Scientific Instruments
·
2
W/HfO2 gate stacks with Tinv～1.2nm and low charge trapping
2003
·
A. Callegari
, P. Jamison
, et al.
·
International Conference on Solid State Devices and Materials (SSDM)
·
1
Solid phase amorphization and crystallization in multilayer and bilayer Rh-Si thin films
1993
·
S.R. Herd
, I.M. Fisher
, et al.
·
Materials Chemistry and Physics
·
1
Crystallization of seeded amorphous Co(Si1−x Gex)2 thin films
1992
·
G.U. Singco
, S.R. Herd
·
Materials Chemistry and Physics
·
1
Charge Trapping, Negative Bias Temperature Instability (NBTI) and Breakdown related Reliability Issues in High k /Gate Dielectric Stacks
2006
·
Sufi Zafar
, Alexander Vayshenker
, et al.
·
ECS Meeting Abstracts
PDF
Electrical simulation of optical bistability
2003
·
K. Daneshvar
, G. Singco
On the nature of the instabilities of bistable electron devices
2002
·
K. Daneshvar
, G. Singco
·
Southeastern Symposium on System Theory (SSST)
Of Bistable Electron Devices
1991
·
K. Daneshvar
, G. Singco
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Works count:
17
Citation count:
789
H-index:
6
I10-index:
4
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