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Didier Hérault

Observed names: D. HERAULT, D. Herault, Didier Herault
OpenAlex ID: A5024296528
Color filters including infrared cut-off integrated on CMOS image sensor
2011 · Laurent Frey, Pascale Parrein, et al. · Optics Express · 92
Fully Optimized Cu based process with dedicated cavity etch for 1.75μm and 1.45μm pixel pitch CMOS Image Sensors
2006 · M. Cohen, F. Roy, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 53
Source follower noise limitations in CMOS active pixel sensors
2004 · Keith M. Findlater, Jerome M. Vaillant, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 36
SXGA pinned photodiode CMOS image sensor in 0.35 μm technology
2003 · K. Findlater, R. Henderson, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 35
Evaluation of color error and noise on simulated images
2009 · Clémence Mornet, Jérôme Vaillant, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 14
Challenges in CMOS‐based images
2013 · Francois Roy, A. Tournier, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 13
A 750 K Photocharge Linear Full Well in a 3.2 μm HDR Pixel with Complementary Carrier Collection
2018 · Frédéric Lalanne, Pierre Malinge, et al. · Sensors · 10
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Versatile method for optical performances characterization of off-axis CMOS pixels with microlens radial shift
2008 · Jérôme Vaillant, Thomas Decroux, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
From photons to electrons: a complete 3D simulation flow for CMOS image sensor
2024 · Axel Crocherie, Pierre Boulenc, et al. · HAL · 7
Finite-difference time domain based electro-optical methodologies to improve CMOS image sensor pixels performances
2010 · Flavien Hirigoyen, Axel Crocherie, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
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Toward a quantitative visual noise evaluation of sensors and image processing pipes
2010 · Clémence Mornet, Donald Baxter, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
Characterization of pixel crosstalk and impact of Bayer patterning by quantum efficiency measurement
2010 · Jérôme Vaillant, Clémence Mornet, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
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An image quality evaluation tool simulating image sensors including quantum efficiency off-axis effect
2010 · Clémence Mornet, Jérôme Vaillant, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2.16µm Back Side Illuminated Voltage Domain Global Shutter CMOS Image Sensor with single silicon layer pixel
2023 · P. Malinge, F. Lalanne, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 2
1.1µm Backside Imager vs. Frontside Imager: an optics-dedicated FDTD approach
2024 · Flavien Hirigoyen, Jérôme Vaillant, et al. · HAL
THX 31162: 768 x 576 pixel area array CCD sensor
1990 · Didier Herault, Gilles C. Boucharlat, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Basic technologies for high-performance solid-state image sensors for CIM applications
1990 · G. BOUCHARLAT, B. DIMITRIADIS, et al. · International Journal of Computer Integrated Manufacturing
TH 7864 Area Array Charge-Coupled Device (CCD) Image Sensor with Built-In Antiblooming Device
1989 · D. Herault, G. Boucharlat · Springer eBooks
Works count: 21
Citation count: 291
H-index: 8
I10-index: 7
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