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L.G. Feinstein
Observed names:
L. Feinstein,
L. G. FEINSTEIN,
L. G. Feinstein,
L.G Feinstein,
Louis Feinstein
Institution:
Textron (United States)
Observed institutions:
AT&T (United States),
Worcester Art Museum,
Worcester Memorial Hospital,
National Aeronautics and Space Administration,
Textron (United States),
Massachusetts Institute of Technology
show all 6
OpenAlex ID:
A5024364170
Ion-beam deposition of thin films of ferroelectric lead zirconate titanate (PZT)
1979
·
R. N. Castellano
, L. G. Feinstein
·
Journal of Applied Physics
·
194
Factors controlling the structure of sputtered Ta films
1973
·
L.G. Feinstein
, R.D. Huttemann
·
Thin Solid Films
·
110
LEED study of the epitaxy of silver on nickel (111)
1970
·
L.G. Feinstein
, E. Blanc
, et al.
·
Surface Science
·
38
Annealing and phase stability of tantalum films sputtered in Ar-O2
1974
·
L.G. Feinstein
, R.D. Huttemann
·
Thin Solid Films
·
29
The failure of aged CuAu thin films by Kirkendall porosity
1979
·
L.G. Feinstein
, J.B. Bindell
·
Thin Solid Films
·
27
Structure and electrical properties of Ta films sputtered in ArO2
1972
·
L.G. Feinstein
, D. Gerstenberg
·
Thin Solid Films
·
26
Low-energy electron diffraction study of vacuum-cleaved (110) cadmium telluride
1965
·
L.G. Feinstein
, D.P. Shoemaker
·
Surface Science
·
24
Investigation of the molecular processes controlling corrosion failure mechanisms in plastic encapsulated semiconductor devices
1981
·
R.M. Lum
, L.G. Feinstein
·
Microelectronics Reliability
·
18
Horizontal Die Cracking as a Yield and Reliability Problem in Integrated Circuit Devices
1987
·
Y. Kasem
, L. Feinstein
·
IEEE Transactions on Components Hybrids and Manufacturing Technology
·
17
LEED study of steps and facets on a Re surface
1969
·
L.G. Feinstein
, M.S. Macrakis
·
Surface Science
·
14
Low-Energy Electron-Diffraction and Surface Conductance Studies of Surface Reaction of Germanium with Oxygen
1971
·
Y. Margoninski
, L. G. Feinstein
·
Journal of Applied Physics
·
12
Performance of New Copper Based Metallization Systems in an 85°C 80-Percent RH Cl2Contaminated Environment
1977
·
N. Sbar
, L. Feinstein
·
IEEE Transactions on Parts Hybrids and Packaging
·
11
Phases Observed in Oxygen-Reactive Sputtering of Tantalum
1971
·
L. G. Feinstein
·
Applied Physics Letters
·
11
Abstract: Ion beam deposition of thin films of ferroelectric lead zirconate titanate (PZT)
1979
·
R. N. Castellano
, L. G. Feinstein
·
Journal of Vacuum Science and Technology
·
9
LEED patterns and electrical conductance of gold plated germanium surfaces
1970
·
Y. Margoninski
, L.G. Feinstein
·
Surface Science
·
9
Determination of nickel-molybdenum surface alloy structures using LEED
1969
·
L.G. Feinstein
, E. Blanc
·
Surface Science
·
9
LEED secondary Bragg peaks for Ni(111)
1970
·
L.G. Feinstein
·
Surface Science
·
8
A simplified modeling technique for finite element thermal analysis of a plastic SOIC package
1999
·
T.W.C. Mak
, L.G. Feinstein
·
IEEE Transactions on Components and Packaging Technologies
·
7
Performance of New Copper-Based Metallization Systems in an 85°C, 78% RH, SO2Contaminated Environment
1979
·
L. Feinstein
, N. Sbar
·
IEEE Transactions on Components Hybrids and Manufacturing Technology
·
7
Degradation of Thermocompression Bonds to Ti-Cu-Au and Ti-Cu Thin Films by Thermal Aging
1980
·
L. Feinstein
, R. Pagano
·
IEEE Transactions on Components Hybrids and Manufacturing Technology
·
6
Role of surface hydroxyls in the nucleation of sputtered tantalum films
1972
·
L.G. Feinstein
, R.D. Huttemann
·
Thin Solid Films
·
6
Reduction of nodules in electron-gun-evaporated Au films
1975
·
L. G. Feinstein
, M. J. Bill
·
Journal of Vacuum Science and Technology
·
5
Polarized neutron diffraction study of ordered VFe
1968
·
L.G. Feinstein
, D.P. Shoemaker
·
Journal of Physics and Chemistry of Solids
·
5
Ta Thin-Film Capacitors with an Al Underlay for High-Frequency Applications
1981
·
L. Feinstein
, R. Pagano
·
IEEE Transactions on Components Hybrids and Manufacturing Technology
·
4
Do flame retardants affect the reliability of molded plastic packages?
1981
·
L.G Feinstein
·
Microelectronics Reliability
·
4
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Works count:
38
Citation count:
626
H-index:
11
I10-index:
13
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