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X.-Y. Liu

Observed name: X.-Y Liu
OpenAlex ID: A5025804166
A new investigation of copper's role in enhancing Al–Cu interconnect electromigration resistance from an atomistic view
1999 · X.-Y Liu, C.-L Liu, et al. · Acta Materialia · 85
Defect generation and diffusion mechanisms in Al and Al–Cu
1999 · C.-L. Liu, X.-Y. Liu, et al. · Applied Physics Letters · 45
Trapping and desorption of energetic Cu atoms on Cu(111) and (001) surfaces at grazing incidence
1999 · D. E. Hanson, J. D. Kress, et al. · Physical review. B, Condensed matter · 14
Ab initio modeling study of boron diffusion in silicon
2001 · W Windl, R Stumpf, et al. · Computational Materials Science · 11
Defect Generation and Diffusion Mechanisms in Al and Al-Cu
1998 · C. - L. Liu, X.-Y. Liu, et al. · MRS Proceedings · 3
Stress Effects on Al and Al(Cu) Thin Film Grain-Boundary Diffusion
1999 · X.-Y. Liu, C.-L. Liu · MRS Proceedings
Works count: 6
Citation count: 158
H-index: 4
I10-index: 4
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