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K. Berresheim
Observed names:
K. H. Berresheim,
K.H. Berresheim
Institutions:
University of Kaiserslautern,
Institut für Oberflächen- und Schichtanalytik GmbH
Observed institutions:
University of Kaiserslautern,
University of Cologne,
Max Planck Institute for Solid State Research,
Heraeus (Germany),
Institut für Oberflächen- und Schichtanalytik GmbH
OpenAlex ID:
A5026626459
Detailed Characterization of Various Porous Alumina-Based Catalyst Coatings Within Microchannels and Their Testing for Methanol Steam Reforming
2003
·
R. Zapf
, C. Becker-Willinger
, et al.
·
Process Safety and Environmental Protection
·
130
A standard form of spectra for quantitative ESCA-analysis
1991
·
K. Berresheim
, M. Mattern-Klosson
, et al.
·
Analytical and Bioanalytical Chemistry
·
63
Photoemission (XPS, UPS) studies of Pd-Si metallic glasses
1979
·
P. Oelhafen
, M. Liard
, et al.
·
Solid State Communications
·
59
Photoemission from Metallic Cesium Oxide Films
1976
·
G. Ebbinghaus
, W. Braun
, et al.
·
Physical Review Letters
·
54
XPS–ISS analysis of Al/Ni alloys
1979
·
S. Storp
, K. Berresheim
, et al.
·
Surface and Interface Analysis
·
13
Charge compensation for XPS on polymers
1993
·
A. P. Pijpers
, K. Berresheim
, et al.
·
Analytical and Bioanalytical Chemistry
·
9
ESCA, SIMS, SEM and XRD investigations of Pt-10%Rh catalyst-gauzes
1989
·
A. P. v. Rosenstiel
, W. H. J. Bruis
, et al.
·
Fresenius Zeitschrift für Analytische Chemie
·
9
Interface characterization of PICVD-coated polymer substrates
1997
·
V. Rupertus
, K. Berresheim
, et al.
·
Fresenius Journal of Analytical Chemistry
·
6
Verfahrenskontrollen und komplement�re Informationen in der Oberfl�chenanalyse durch Kombinationsger�te
1984
·
K. Berresheim
·
Analytical and Bioanalytical Chemistry
·
3
Entscheidende Kriterien für die Small-Spot-XPS-Analyse
1987
·
J. Krizek
, K. Berresheim
, et al.
·
Fresenius Zeitschrift für Analytische Chemie
·
2
Experimentelle Bestimmung oberer Schranken f�r Matrix-Effekte in XPS
1984
·
K. Berresheim
·
Analytical and Bioanalytical Chemistry
·
2
Empfindlichkeits-Faktoren für quantitative ESCA, gemessen unter UHV-Bedingungen
1983
·
K. Berresheim
·
Fresenius Zeitschrift für Analytische Chemie
·
1
Ionen-Ansprechwahrscheinlichkeit von Dampfz�hlern
1967
·
K. Berresheim
·
The European Physical Journal A
·
1
ESCA, SIMS, SEM and XRD investigations of Pt-10%RH catalyst-gauzes
1989
·
A.P. v. Rosenstiel
, W.H.J. Bruis
, et al.
·
Ultramicroscopy
Ion Registration Probability of Vapor Counters.
1967
·
K. Berresheim
·
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
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Works count:
15
Citation count:
352
H-index:
7
I10-index:
5
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