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Gérard Vuye

Temperature dependence of the dielectric function of silicon using in situ spectroscopic ellipsometry
1993 · G. Vuye, S. Fisson, et al. · Thin Solid Films · 160
Roughening of Ag surfaces by Ag deposits studied by differential reflectivity
1984 · T. López-Ríos, Y. Borensztein, et al. · Physical review. B, Condensed matter · 46
Splitting of the Al surface plasmon dispersion curves by Ag surface layers
1978 · T. Lopez-Rios, F. Abelès, et al. · Journal de physique · 45
Optical properties of Si nanocrystals embedded in SiO2
2005 · B. Gallas, I. Stenger, et al. · Physical Review B · 44
Change of TO and LO mode frequency of evaporated SiO2 films during aging in air
2000 · A. Brunet-Bruneau, S. Fisson, et al. · Journal of Applied Physics · 40
Initial stages in the formation of PtSi on Si(111) as followed by photoemission and spectroscopic ellipsometry
1995 · L. Ley, Y. Wang, et al. · Thin Solid Films · 40
Use of surface plasmon excitation for determination of the thickness and optical constants of very thin surface layers
1979 · T. Lopez-Rios, G. Vuye · Surface Science · 38
SiO 2 – TiO 2 interfaces studied by ellipsometry and x-ray photoemission spectroscopy
2002 · B. Gallas, A. Brunet-Bruneau, et al. · Journal of Applied Physics · 35
Roughness induced at Si(111) surfaces by high temperature heating
1990 · Y. Borensztein, T. Lopez-Rios, et al. · Applied Surface Science · 32
Laser annealing of SiOx thin films
2002 · B Gallas, C.-C Kao, et al. · Applied Surface Science · 31
Relations between the optical properties and the microstructure of TiO2 thin films prepared by ion-assisted deposition
2000 · Y Leprince-Wang, D Souche, et al. · Thin Solid Films · 30
Microstructural characterization of ion assisted SiO2 thin films by visible and infrared ellipsometry
1998 · A. Brunet-Bruneau, D. Souche, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 30
Comparative study of Ag growth on (111) Au and Cu substrates
1988 · Y. Borensztein, T. Lopez-Rios, et al. · Physical review. B, Condensed matter · 28
Making an omnidirectional reflector
2001 · Bruno Gallas, Serge Fisson, et al. · Applied Optics · 27
Determination of the infrared optical constants of highly reflecting materials by means of surface plasmon excitation-application to Pd
1978 · J Lafait, F Abeles, et al. · Journal of Physics F Metal Physics · 26
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Étude de quelques facteurs déterminant la croissance et la cristallisation des films anodiques sur le titane en milieu acide
1978 · G. Jouve, A. Politi, et al. · Journal of the Less Common Metals · 24
Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity
2000 · A Brunet-Bruneau, S Fisson, et al. · Thin Solid Films · 23
Influence of Al submonolayers on surface-enhanced raman scattering of pyridine on Ag surfaces
1984 · T. López-Ríos, Y. Gao, et al. · Chemical Physics Letters · 23
Dielectric constant of gold, copper, and gold-copper alloys between 18 and 35 eV
1979 · D. Beaglehole, M. De Crescenzi, et al. · Physical review. B, Condensed matter · 20
Investigation of metallic surface layers on metals by surface plasmon ATR spectroscopy
1979 · T. Lopez-Rios, F. Abelès, et al. · Journal de Physique Lettres · 20
Evolution of the optical properties of Si nanoparticles embedded in SiO2 as function of annealing conditions
2008 · I. Stenger, B. Gallas, et al. · Journal of Applied Physics · 19
In situ investigation of metallic surfaces by surface plasmon ATR spectroscopy, electrical resistance measurements and Auger spectroscopy
1982 · T Lopez-Rios, G Vuye · Journal of Physics E Scientific Instruments · 16
Determination of refractive-index profiles by a combination of visible and infrared ellipsometry measurements
1996 · V. Nguyen Van, A. Brunet-Bruneau, et al. · Applied Optics · 15
Dielectric function of Si nanocrystals embedded in SiO2
2004 · B. Gallas, Chih-Cheng Kao, et al. · Thin Solid Films · 14
Visible and infrared ellipsometry study of ion assisted SiO2 films
1998 · D. Souche, A. Brunet-Bruneau, et al. · Thin Solid Films · 13
Works count: 69
Citation count: 1,018
H-index: 20
I10-index: 33
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