Author

Jason Li

Institution: AmberWave (United States)

Observed institution: AmberWave (United States)

OpenAlex ID: A5028638932

(Invited) Aspect Ratio Trapping: A Unique Technology for Integrating Ge and III-Vs with Silicon CMOS

2010 · James G. Fiorenza, Ji-Soo Park, et al. · ECS Transactions · 77

Aspect Ratio Trapping: A Unique Technology for Integrating Ge and III-Vs with Silicon CMOS

2010 · James G. Fiorenza, Ji-Soo Park, et al. · ECS Meeting Abstracts · 4

Works count: 2

Citation count: 81

H-index: 2

I10-index: 1