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Author

K R Chandrika

Observed names: Chandrika K R, Chandrika KR, K R, Chandrika, K. R. Chandrika, K.R. Chandrika, Kr Chandrika
Institution: ABB (India)
ORCID: 0000-0003-3032-3030
Observed ORCID: 0000-0003-3032-3030
OpenAlex ID: A5029473113
Automated Control Logic Test Case Generation using Large Language Models
2024 · Heiko Koziolek, Virendra Ashiwal, et al. · IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) · 39
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Recognizing eye tracking traits for source code review
2017 · K R Chandrika, J Amudha, et al. · IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) · 24
Measuring the Robustness of ML Models Against Data Quality Issues in Industrial Time Series Data
2023 · Marcel Dix, Gianluca Manca, et al. · IEEE International Conference on Industrial Informatics (INDIN) · 17
A fuzzy inference system to recommend skills for source code review using eye movement data
2018 · K.R. Chandrika, J. Amudha · Journal of Intelligent & Fuzzy Systems · 12
Training industrial end‐user programmers with interactive tutorials
2022 · Nico Ritschel, Anand Ashok Sawant, et al. · Software Practice and Experience · 9
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Suitability of Genetic Algorithm and Particle Swarm Optimization for Eye Tracking System
2016 · J. Amudha, K.R. Chandrika · IEEE International Conference on Advanced Computing (IACC) · 8
Learner stimulus intent: a framework for eye tracking data collection and feature extraction in computer programming education
2025 · K. R. Chandrika, J. Amudha · Scientific Reports · 7
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Eye movements dataset for objective-based assessment of object-oriented programming knowledge
2023 · Chandrika K R, Amudha J · Data in Brief · 7
Identification and Classification of Expertise Using Eye Gaze—Industrial Use Case Study with Software Engineers
2020 · K. R. Chandrika, J. Amudha, et al. · Lecture notes in networks and systems · 5
UDDT: An Unsupervised Drift Detection Method for Industrial Time Series Data
2023 · Deepti Maduskar, Divyasheel Sharma, et al. · IEEE Industrial Electronics Society Annual On-Line Conference (ONCON) · 4
Automatic feedback captions for eye-tracker based online assessment
2023 · Ujjwal Kumar, Amudha J, et al. · International Conference on Advances in Intelligent Computing and Applications (AICAPS) · 3
PIDPipe: A Pipeline for Digitizing P&ID with Unsupervised Symbol Localization
2023 · Akhilesh Bisht, Chandrika K R, et al. · IEEE Industrial Electronics Society Annual On-Line Conference (ONCON) · 2
KIKO: A Tools Framework for Industrial Domain-specific Natural Language Processing Tasks
2023 · Abdulla PP, Divyasheel Sharma, et al. · International Conference on Communication, Computing and Industry 4.0 (C2I4) · 1
DeviceVeri-A Graphical Programming Based Test Script Generation Framework for Measurement Devices
2023 · Chandrika K R, Santonu Sarkar, et al. · IEEE Industrial Electronics Society Annual On-Line Conference (ONCON) · 1
Assessing Reading Patterns of Learners Through Eye Tracking
2023 · Agashini V. Kumar, Atharwa Wagh, et al. · Lecture notes in computer science · 1
Automatic Control Code Generation from SAMA Specification
2021 · Santonu Sarkar, Chandrika K R · IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) · 1
How Much Do Patterns Help in Architecting Agentic AI Systems for Industrial Plants? — Replication Package
2026 · Sridhar, Chandrasekar, Muttannagaru, Pranav Reddy, et al. · Zenodo (CERN European Organization for Nuclear Research)
Human–AI Agent Collaboration for Industrial Problem Solving
2026 · Petra Björndal, Yanqing Zhang, et al. · Nordic Conference on Human-Computer Interaction
Rethinking the Role of Control Room Operators in Highly Automated Process Industries
2026 · Chandrika K R, Yanqing Zhang, et al. · IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)
Agent Based Modelling for Migration of Industrial Control Systems
2019 · Devina Mohan, K.R. Chandrika, et al. · Conference proceedings/Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics
Works count: 21
Citation count: 140
H-index: 7
I10-index: 4
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