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Author

Youbean Kim

Observed name: Youbean KIM
Institution: Myongji University
ORCID: 0009-0008-3317-9859
Observed ORCID: 0009-0008-3317-9859
OpenAlex ID: A5029578836
Technologies and Solutions for Cattle Tracking: A Review of the State of the Art
2024 · Saúl Montalván, Pablo Arcos, et al. · Sensors · 24
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Low Loss Hybrid-Plane PCB Structure for Improving Signal Quality in High-Speed Signal Transmission
2024 · Jeonghyeon Choi, Youbean Kim · IEEE Access · 16
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A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture
2005 · Youbean Kim, Myung-Hoon Yang, et al. · Proceedings - Asian Test Symposium/Proceedings · 16
The economic benefits of big science R&D: With a focus on fusion R&D program in Korea
2017 · Wonjae Choi, Hyunsoo Tho, et al. · Fusion Engineering and Design · 7
A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC
2009 · Hyeonuk Son, Jaewon Jang, et al. · International SoC Design Conference · 4
Exploring Emerging Technologies with Analysis of Bibliographic Data Focused on Plasma Surface Treatment
2021 · Youbean Kim · Coatings · 3
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Deep Learning-Based Faulty Component Diagnosis of Transmission Channels in ATE Affected by Thermal Degradation
2026 · Jimin Gu, Jeonghyeon Choi, et al. · IEEE Access · 1
FPGA-based SPI Module System Implementation for Various DPS Evaluations in ATE
2025 · Junhyeong Ji, Jonghee Park, et al. · JSTS Journal of Semiconductor Technology and Science · 1
Exploring Alternative Futures Focusing on the Science and Technology Policy of Kim Jong‐un's Regime*
2024 · Keonyeong Jeong, Kyungmoo Heo, et al. · Pacific Focus · 1
Forecasting the Environmental Change of Technological Innovation System in South Korea in the COVID-19 Era
2020 · Youbean Kim, Soyeon Park, et al. · Asian Journal of Innovation and Policy · 1
Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method
2010 · Youbean KIM, Jaewon JANG, et al. · IEICE Transactions on Information and Systems · 1
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Variable-length block nine-coded compression technique with Huffman codes and symbol merging
2008 · Jaewon Jang, Youbean Kim, et al. · International SoC Design Conference · 1
TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure
2006 · Youbean Kim, Dongsup Song, et al. · Proceedings - Asian Test Symposium/Proceedings · 1
Thermal Degradation Diagnosis of ATE Driver Boards Using ALT-Derived Cumulative Degradation Time
2026 · Heechan Lee, Seongbeom Hong, et al. · Electronics
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A Cost-Effective Approach to PCB Structure and Process for Enhanced High-Speed Signal Integrity
2025 · Jeonghyeon Choi, Youbean Kim · IEEE Region 10 Conference (TENCON)
Research on Emerging Issue Analysis from Korean R&D Investment Direction
2023 · Dongheun Ha, Mi-Young Hong, et al. · IEEE Asia-Pacific Conference on Computer Science and Data Engineering (CSDE)
Global Infectious Diseases and Social Issues from SARS to Coronaᐨ19
2020 · Seong-Won Park, Youbean Kim · Journal of Korean Social Trend and Perspective
Core Technologies Derivation of Fusion DEMO Reactor Applying TRL and AHP
2014 · Hansoo Chang, 국가핵융합연구소 미래전략실, et al. · The Korea Society for Innovation Management & Economics
Core Technologies Derivation of Fusion DEMO Reactor Applying TRL and AHP
2014 · 국가핵융합연구소 미래전략실, Hansoo CHANG, et al. · The Korea Society for Innovation Management & Economics
Built-in Self-test for A/D Converters in the Presence of Transient Zones
2007 · Incheol Kim, Kicheol Kim, et al. · 대한전자공학회 ISOCC
An Improved False Aggressor Pruning Algorithm for Effective Crosstalk Tests
2007 · HyungJun Cho, Kyungmin Kim, et al. · 대한전자공학회 ISOCC
A New Low Power BIST Architecture Based on Probability Models
2007 · Hyeonuk Son, Youbean Kim, et al. · 대한전자공학회 ISOCC
An Efficient BIST (Built-in Self-test) for A/D converters
2007 · Kicheol Kim, Youbean Kim, et al. · 대한전자공학회 ISOCC
Transition Repression Architecture for scan CEll (TRACE) in a BIST environment
2006 · Incheol Kim, Dongsup Song, et al. · Journal of the Institute of Electronics Engineers of Korea
High Correlative Low Power Test Pattern Generator Using a Transition Monitoring Window
2005 · Youbean Kim, Myung-Hoon Yang, et al. · 대한전자공학회 학술대회
Works count: 26
Citation count: 77
H-index: 4
I10-index: 3
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