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Author

Alfredo Benso

Observed names: A. Benso, Alfredo BENSO, BENSO, Alfredo, Benso A., Benso Alfredo, Benso, Alfredo, Prof. Alfredo Benso
ORCID: 0000-0003-3433-7739
Observed ORCID: 0000-0003-3433-7739
OpenAlex ID: A5030177680
The CAFA challenge reports improved protein function prediction and new functional annotations for hundreds of genes through experimental screens
2019 · Naihui Zhou, Yuxiang Jiang, et al. · Genome biology · 454
An expanded evaluation of protein function prediction methods shows an improvement in accuracy
2016 · Yuxiang Jiang, Tal Ronnen Oron, et al. · Genome biology · 399
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Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
2004 · Benso, Alfredo, Prinetto, Paolo · Kluwer Academic Publishers eBooks · 179
A C/C++ source-to-source compiler for dependable applications
2002 · A. Benso, S. Chiusano, et al. · International Conference on Dependable Systems & Networks/Proceedings · 86
Estimation of sickness absenteeism among Italian healthcare workers during seasonal influenza epidemics
2017 · Maria Michela Gianino, Gianfranco Politano, et al. · PLoS ONE · 65
Multi-level and hybrid modelling approaches for systems biology
2017 · R. Bardini, G. Politano, et al. · Computational and Structural Biotechnology Journal · 63
The CAFA challenge reports improved protein function prediction and new functional annotations for hundreds of genes through experimental screens
2019 · Naihui Zhou, Yuxiang Jiang, et al. · bioRxiv (Cold Spring Harbor Laboratory) · 62
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Fault-list collapsing for fault-injection experiments
1998 · A. Benso, M. Rebaudengo, et al. · Annual Reliability and Maintainability Symposium (RAMS) · 61
A watchdog processor to detect data and control flow errors
2004 · A. Benso, S. Di Carlo, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 60
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Cost of Sickness Absenteeism during Seasonal Influenza Outbreaks of Medium Intensity among Health Care Workers
2019 · Maria Michela Gianino, Gianfranco Politano, et al. · International Journal of Environmental Research and Public Health · 56
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Beyond Homology Transfer: Deep Learning for Automated Annotation of Proteins
2018 · Mohammad Nauman, Hafeez Ur Rehman, et al. · Journal of Grid Computing · 53
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An on-line BIST RAM architecture with self-repair capabilities
2002 · A. Benso, S. Chiusano, et al. · IEEE Transactions on Reliability · 49
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March AB, march AB1: new march tests for unlinked dynamic memory faults
2006 · A. Benso, A. Bosio, et al. · IEEE International Test Conference (ITC) · 43
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Control-flow checking via regular expressions
2002 · A. Benso, S. Di Carlo, et al. · Proceedings - Asian Test Symposium/Proceedings · 43
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A combined approach for genome wide protein function annotation/prediction
2013 · Alfredo Benso, Stefano Di Carlo, et al. · Proteome Science · 39
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Statistical Reliability Estimation of Microprocessor-Based Systems
2011 · A. Savino, S. Di Carlo, et al. · IEEE Transactions on Computers · 37
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Fault behavior observation of a microprocessor system through a VHDL simulation-based fault injection experiment
2002 · A.M. Amendola, A. Benso, et al. · European Design Automation Conference (EURO-DAC) · 35
HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs
2002 · A. Benso, S. Chiusano, et al. · IEEE International Test Conference (ITC) · 35
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Data criticality estimation in software applications
2004 · A. Benso, S. Di Carlo, et al. · IEEE International Test Conference (ITC) · 32
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FishAPP: A mobile App to detect fish falsification through image processing and machine learning techniques
2016 · Francesco Rossi, Alfredo Benso, et al. · IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) · 30
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Specification and design of a new memory fault simulator
2003 · A. Benso, S. Di Carlo, et al. · Proceedings - Asian Test Symposium/Proceedings · 29
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An effective distributed BIST architecture for RAMs
2002 · M. Lobetti Bodoni, A. Benso, et al. · IEEE European Test Symposium (ETS) · 29
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A programmable BIST architecture for clusters of multiple-port SRAMs
2002 · A. Benso, S. Di Carlo, et al. · IEEE International Test Conference (ITC) · 28
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A Functional Verification based Fault Injection Environment
2007 · A. Benso, A. Bosio, et al. · Proceedings · 27
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ATPG for Dynamic Burn-In Test in Full-Scan Circuits
2006 · Alfredo BENSO, Alberto BOSIO, et al. · Proceedings - Asian Test Symposium/Proceedings · 27
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Works count: 221
Citation count: 2,997
H-index: 27
I10-index: 66
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