Author

Sergey N. Yarishev

Observed names: S. N. Yarishev, S.N. Yarishev, Sergey Yarishev
Institution: ITMO University
Observed institution: ITMO University
ORCID: 0000-0003-0052-3859
Observed ORCID: 0000-0003-0052-3859
OpenAlex ID: A5030503655
2015 · Vasiliy P. Lazarenko, Sergey Yarishev, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
2011 · Andrey G. Anisimov, Oleg U. Lashmanov, et al. · Frontiers in Optics · 9
2024 · Dmitrii I. Krasnov, Sergey N. Yarishev, et al. · International Scientific Conference Electronics (ET) · 5
2022 · Ruslan D. Khlynov, Victoria A. Ryzhova, et al. · Micromachines · 5
2016 · V.P. Lazarenko, T.S. Dzhamiykov, et al. · Scientific and technical journal of information technologies mechanics and optics · 4
2025 · Platon A. Kravtsov, Victoria A. Ryzhova, et al. · International Scientific Conference Electronics (ET) · 2
2022 · Cong T. Nguyen, Ruslan D. Khlynov, et al. · International Scientific Conference Electronics (ET) · 2
2024 · Artemii Y. Zhdanov, Victoria A. Ryzhova, et al. · International Scientific Conference Electronics (ET) · 1
2026 · Platon A. Kravtsov, Victoria A. Ryzhova, et al.
2025 · Daniil V. Gushchin, Victoria A. Ryzhova, et al. · International Scientific Conference Electronics (ET)
2025 · Danila A. Titov, Victoria A. Ryzhova, et al. · International Scientific Conference Electronics (ET)
2024 · Ruslan D. Khlynov, Victoria A. Ryzhova, et al. · International Scientific Conference Electronics (ET)
2024 · Platon A. Kravtsov, Victoria A. Ryzhova, et al. · International Scientific Conference Electronics (ET)
2024 · Ruslan D. Khlynov, Victoria A. Ryzhova, et al. · Studies in systems, decision and control
2024 · Ruslan D. Khlynov, Victoria A. Ryzhova, et al. · Studies in systems, decision and control
2023 · R. D. Khlynov, V. A. Ryzhova, et al. · Journal of Optical Technology
2021 · Ruslan Khlynov, Victoria Ryzhova, et al. · International Scientific Conference Electronics (ET)
2019 · Ba Minh Dinh, Valery V. Korotaev, et al. · Optical Measurement Systems for Industrial Inspection XI
2016 · Yuri P. Baranov, Sergey N. Yarishev, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
2015 · A. V. Sotnik, S. N. Yarishev, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 25
Citation count: 42
H-index: 5
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