Author

N. Zougagh

Observed name: N. ZOUGAGH

Institution: University of Abou Bekr Belkaïd

Observed institutions: University of Abou Bekr Belkaïd, Université Djilali de Sidi Bel Abbès

OpenAlex ID: A5030734962

The dc Electrical Characterization of Hg/δ-GaN/n-GaAs Devices, with Different Thicknesses of the GaN Thin Layers

2011 · N. Zougagh, Z. Benamara, et al. · Sensor Letters · 8

Study of the Characteristics Current–Voltage and Capacity–Voltage of Hg/GaN/GaAs Structures

2011 · K. Ameur, H. Mazari, et al. · Sensor Letters · 5

Simulation and electrical characterization of InN/InP diodes

2016 · B. Hadjadj, Z. Benamara, et al. · Molecular Crystals and Liquid Crystals · 2

Electrical optimization of metal/GaN/GaAs structures: role of GaN thickness, contact metal, and frequency

2025 · N. Zougagh, A. Guen, et al. · Digest Journal of Nanomaterials and Biostructures

Physical Mechanisms Responsible for Electrical Conduction in Pt/GaN Schottky Diodes

2014 · H. MAZARI, K. AMEUR, et al. · DOAJ (DOAJ: Directory of Open Access Journals)

Works count: 5

Citation count: 15

H-index: 2

I10-index: