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Author

A. K. Tyavlovsky

Observed names: Andrey Tyavlovsky, Tyavlovsky, A., Tyavlovsky, Andrey
ORCID: 0000-0003-2579-1016
Observed ORCID: 0000-0003-2579-1016
OpenAlex ID: A5031198353
Design of a metasurface loaded with RF varactor and PIN diode integration dual-band reconfigurable antenna for bluetooth, Wi-Fi, WLAN and wireless 5G applications
2025 · Suyog Pande, Dipak Patil, et al. · Physica Scripta · 9
The effect of high-dispersion fillers on adhesive and frictional properties of ethylene-vinyl acetate copolymer
2014 · A. I. Sviridenok, A. L. Zharin, et al. · Journal of Friction and Wear · 9
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Surface Electric Potential Measurement with a Static Probe
2023 · R. I. Vorobey, O. K. Gusev, et al. · Devices and Methods of Measurements · 5
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Digital Contact Potential Difference Probe
2016 · K. U. Pantsialeyeu, A. I. Svistun, et al. · Devices and Methods of Measurements · 5
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Characterization of the Electrophysical Properties of Silicon-silicon Dioxide Interface Using Probe Electrometry Methods
2017 · V. А. Pilipenko, V. A. Saladukha, et al. · Devices and Methods of Measurements · 4
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Kelvin probe error compensation based on harmonic analysis of measurement signal
2014 · A. K. Tyavlovsky, А. Л. Жарин, et al. · Electronic scientific archive of UrFU (Ural Federal University) · 3
Photoelectric semiconductor converters with a large dynamic range
2014 · R. I. Vorobey, О. К. Гусев, et al. · Electronic scientific archive of UrFU (Ural Federal University) · 3
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Digital Contact Potential Probe in Studying the Deformation of Dielectric Materials
2020 · Kanstantsin Pantsialeyeu, Anatoly Zharin, et al. · Informatyka Automatyka Pomiary w Gospodarce i Ochronie Środowiska · 2
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Analysis of Surface Defects of Aluminum and Its Alloys With a Scanning Kelvin Probe
2017 · A. K. Tyavlovsky, A. L. Zharin, et al. · Devices and Methods of Measurements · 2
Kelvin Probe's Stray Capacitance and Noise Simulation
2014 · S. Danyluk, А. В. Дубаневич, et al. · Electronic scientific archive of UrFU (Ural Federal University) · 2
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Analysis and Characterization of Metamaterial Structure
2024 · S. V. Pande, D. P. Patil, et al. · Russian Physics Journal · 1
Measuring transducers for optical diagnostic system with multifunctional unitary photovoltaic converters
2018 · R. I. Vorobei, O. K. Gusev, et al. · Devices and Methods of Measurements · 1
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Study of Silicon-insulator Structure Defects Based on Analysis of a Spatial Distribution of a Semiconductor Wafers’ Surface Potential
2015 · R. I. Vorobey, O. K. Gusev, et al. · Instruments and Methods of Measurement (Belarusian National Technical University) · 1
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System for the potential map of metal and semiconductor surfaces monitoring
2010 · A. K. Tyavlovsky, А. Л. Жарин · 1
Structural and electrical characterizations of polysulfone foil electrets under nonisothermal conditions
2025 · Rashmi J. Nayak, Jyotiprakash G. Nayak, et al. · Russian Physics Journal
Detection of Hidden Defects Induced by Thermomechanical Processing of Aluminum Substrates for Sensor Devices Using a Scanning Kelvin Probe
2025 · A. L Zharin, I. V. Gasenkova, et al. · Devices and Methods of Measurements
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An investigation into the power-performance trade-off in memristor-augmented sense amplifiers for nanoscale SRAM
2025 · Musiiwa, P. B., Rushambwa, M. C., et al. · Repository of Belarusian National Technical University (Belarusian National Technical University)
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A parallel virtual instrumentation framework for improving diagnostic efficiency in bed-of-nails testers
2025 · Chamunorwa, T., Musiiwa, P. B., et al. · Repository of Belarusian National Technical University (Belarusian National Technical University)
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The silicon shield: a synergistic, hardware-anchored architecture for next-generation cyber resilience
2025 · Musiiwa, P. B., Rushambwa, M. C., et al. · Repository of Belarusian National Technical University (Belarusian National Technical University)
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Series of Photovoltaic Converters Based on Semiconductors with Intrinsic Photoconductivity
2021 · R. I. Vorobey, O. K. Gusev, et al. · Devices and Methods of Measurements
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Metrological Performance Modeling of Probe Electrometers Capacitive Sensors
2015 · A. K. Tyavlovsky, O. K. Gusev, et al. · Instruments and Methods of Measurement (Belarusian National Technical University)
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Kelvin Probe Self-calibration Mode for Semiconductor Wafers Properties Monitoring
2015 · R. I. Vorobey, O. K. Gusev, et al. · DOAJ (DOAJ: Directory of Open Access Journals)
Compensation of Measurement Errors When Reducing Linear Dimensions of the Kelvin Probe
2015 · A. K. Tyavlovsky, A. L. Zharin · DOAJ (DOAJ: Directory of Open Access Journals)
Выбор базовой подложки для изучения взаимодействия в системе клетка-поверхность методом измерения контактной разности потенциалов
2015 · А. К. Тявловский, Л. В. Цедик, et al. · Electronic scientific archive of UrFU (Ural Federal University)
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Complex-harmonic analysis of electric circuit containing a vibrating-plate capacitor
2012 · A. K. Tyavlovsky, А. Л. Жарин · Informatyka Automatyka Pomiary w Gospodarce i Ochronie Środowiska
Works count: 27
Citation count: 48
H-index: 4
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