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László Makai

Observed names: Laszlo Makai, László Makai, Makai, László
Institution: Semilab (Hungary)
ORCID: 0000-0002-2020-4065
Observed ORCID: 0000-0002-2020-4065
OpenAlex ID: A5031738850
Optical Properties of TiO 2 Grown by Atomic Layer Deposition Using Various Oxidizing Agents: The Ellipsometry Analysis of Absorption Properties
2024 · Jorge Luis Vazquez‐Arce, Tibor Suta, et al. · Advanced Materials Interfaces · 16
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Spectroscopic ellipsometry on metal and metal-oxide multilayer hybrid plasmonic nanostructures
2013 · Akram A. Khosroabadi, Palash Gangopadhyay, et al. · Optics Letters · 16
Spectroscopic ellipsometry investigation of free liquid-liquid and liquid-air interfaces
2022 · László Makai, Benjamin Kalas, et al. · Thin Solid Films · 14
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Breakthrough instruments and products: Investigation of atomic layer deposited Al:ZnO layer by spectroscopic ellipsometry from the deep-UV to the mid-IR in one instrument
2021 · László Makai, Tero Lehto, et al. · Review of Scientific Instruments · 6
Computer simulation of the operating pressure of tungsten halogen lamps
2005 · László Makai, György Hárs, et al. · Journal of Physics D Applied Physics · 3
Integration of Reflectometry into a FOUP for Improved Cycle Time
2019 · Arpad Jakab, John Byrnes, et al. · ASMC proceedings · 2
Demonstration of Quantitative Mid-Infrared Hydrocarbon Aerosol Absorption Spectroscopy Using a Dual-Cell Photoacoustic System
2026 · Jamshed Saeed Shah, Abdul Rahman, et al. · Analytical Chemistry
Spectroscopic Ellipsometric Investigations on Organic/Inorganic Liquid Surfaces in Mid‐IR Range
2026 · László Makai, Bálint Fodor, et al. · Applied Research
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Challenges in Measuring Thin SiO2 Layers on 4H-SiC via Spectroscopic Ellipsometry
2026 · László Makai, Julien Körfer, et al. · Materials science forum
Multiple-incidence-plane ellipsometer with shared detection arm for inspection of solar cell industry samples
2026 · Laszlo Makai, Csaba Balogh, et al. · Solar Energy Materials and Solar Cells
Challenges in Measuring Thin SiO2 Layers on 4H-SiC via Spectroscopic Ellipsometry
2026 · Makai, László, Körfer, Julien, et al. · Fraunhofer-Publica (Fraunhofer-Gesellschaft)
Optical Characterization of Dielectric Liquids for Liquid-Encapsulated Photovoltaic Modules
2026 · Urvashi Bothra, Thomas Rijsman, et al. · SSRN Electronic Journal
Spectroscopic ellipsometry on metal and metal-oxide multilayer hybrid plasmonic nanostructures: erratum
2014 · Akram A. Khosroabadi, Palash Gangopadhyay, et al. · Optics Letters
Works count: 13
Citation count: 57
H-index: 4
I10-index: 3
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