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N. Gnenifi

Observed institution: University Ferhat Abbas of Setif
OpenAlex ID: A5032036004
Relation between MOSFET degradation and interface-states generation
2002 · N. Gnenifi, F. Djahli, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 1
Works count: 1
Citation count: 1
H-index: 1
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