Author

Sven Dewilde

Observed name: Dewilde, Sven
Institution: IMEC
Observed institutions: IMEC, KU Leuven
ORCID: 0000-0003-2269-2127
Observed ORCID: 0000-0003-2269-2127
OpenAlex ID: A5032092089
2020 · Mehmet Ali Recai Önal, Sven Dewilde, et al. · Green Chemistry · 63
2015 · Sven Dewilde, Wim Dehaen, et al. · Green Chemistry · 60
2017 · Sven Dewilde, Tom Vander Hoogerstraete, et al. · ACS Sustainable Chemistry & Engineering · 41
2023 · Soon-Aik Chew, Boyao Zhang, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 39
2017 · Sven Dewilde, Jonas Winters, et al. · Macromolecules · 27
2024 · Boyao Zhang, Soon-Aik Chew, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 26
2022 · Soon-Aik Chew, Serena Iacovo, et al. · IEEE Electronics Packaging Technology Conference (EPTC) · 20
2024 · Ye Lin, Pieter Bex, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 19
2025 · Stefaan Van Huylenbroeck, Soon Aik Chew, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 15
2026 · Stefaan Van Huylenbroeck, Lieve Bogaerts, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 10
2011 · Sven Van Elshocht, Annelies Delabie, et al. · ECS Transactions · 8
2025 · Stefaan Van Huylenbroeck, Soon Aik Chew, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 4
2025 · Kohei Nakayama, Kenta Hayama, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 4
2025 · Joeri De Vos, James Myers, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 3
2025 · Soon-Aik Chew, Yoichi Tanaka, et al. · IEEE Electronics Packaging Technology Conference (EPTC) · 2
2026 · Yang Han, Yoichi Tanaka, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
2026 · Serena Iacovo, koen D'havé, et al. · Research Square
2026 · Joke De Messemaeker, Boyao Zhang, et al. · IEEE Electronic Components and Technology Conference (ECTC)
2026 · Stefaan Van Huylenbroeck, Soon Aik Chew, et al. · IEEE International Reliability Physics Symposium proceedings
2026 · IEEE International Symposium on Reliability Physics 2026, Beyne, Eric, et al. · Underline Science Inc.
2014 · Sven Dewilde, Koen Binnemans, et al. · Lirias
2011 · Sven Van Elshocht, Annelies Delabie, et al. · ECS Meeting Abstracts
Works count: 24
Citation count: 341
H-index: 10
I10-index: 10
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