Author

A Boudjani

Observed name: A. Boudjani

Institution: Université Oran 1 Ahmed Ben Bella

Observed institutions: Centre National de la Recherche Scientifique, Université Oran 1 Ahmed Ben Bella, Université de Lille, Université Djilali de Sidi Bel Abbès

OpenAlex ID: A5032738352

Direct measurement of minority carrier diffusion length in planar devices

1995 · A. Boudjani, G. Bassou, et al. · Solid-State Electronics · 15

Cl and EBIC analysis of a p+ -InGaAs/n-InGaAs/n-InP/n+ -InP heterostructure

1996 · A. Boudjani, B. Sieber, et al. · Materials Science and Engineering B · 7

EBIC determination of lateral dopant diffusion and junction depth in planar devices

1995 · A Boudjani, B Sieber, et al. · Semiconductor Science and Technology · 5

Diffusion length measurement with a quick EBIC technique

2005 · A Boudjani · Semiconductor Science and Technology · 4

Works count: 4

Citation count: 31

H-index: 4

I10-index: 1