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Xukang Wei
Observed names:
Wei, X.,
X. Wei
Observed institutions:
Philips (Netherlands),
Delft University of Technology
ORCID:
0000-0002-8894-2232
Observed ORCID:
0000-0002-8894-2232
OpenAlex ID:
A5033200319
Cramér-Rao lower bound and maximum-likelihood estimation in ptychography with Poisson noise
2020
·
Xukang Wei
, H. Paul Urbach
, et al.
·
Physical Review A
·
19
PDF
Exploiting evanescent-wave amplification for subwavelength low-contrast particle detection
2017
·
S. Roy
, S. F. Pereira
, et al.
·
Physical Review A
·
19
PDF
Ptychography with multiple wavelength illumination
2019
·
Xukang Wei
, Paul Urbach
·
Optics Express
·
10
Three dimensional rigorous model for optical scattering problems
2006
·
Xukang Wei
·
Research Repository (Delft University of Technology)
·
5
Parameter retrieval of small particles in dark-field Fourier ptychography and a rectangle in real-space ptychography
2021
·
Xukang Wei
, H. Paul Urbach
, et al.
·
Ultramicroscopy
·
2
PDF
Super-bright LCD display for radiology; effect on search performance
2005
·
H. M. Visser
, N. Fisekovic
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Three dimensional model for scattering problems in optics
2003
·
X. Wei
, A.J.H. Wachters
, et al.
·
Frontiers in Optics
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Works count:
8
Citation count:
55
H-index:
4
I10-index:
3
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