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Olivier Potin

Making predictive analog/RF alternate test strategy independent of training set size
2012 · Haithem Ayari, Florence Azais, et al. · Proceedings/Proceedings - International Test Conference · 49
Smart selection of indirect parameters for DC-based alternate RF IC testing
2012 · Haithem Ayari, Florence Azais, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 40
Experimental Analysis of the Laser-Induced Instruction Skip Fault Model
2019 · Jean-Max Dutertre, Timothé Riom, et al. · Lecture notes in computer science · 35
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS
2014 · J.M. Dutertre, R. Possamai Bastos, et al. · Microelectronics Reliability · 32
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Experimental Analysis of the Electromagnetic Instruction Skip Fault Model
2020 · Alexandre Menu, Jean-Max Dutertre, et al. · 30
Runtime Code Polymorphism as a Protection Against Side Channel Attacks
2016 · Damien Couroussé, Thierno Barry, et al. · Lecture notes in computer science · 22
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection
2013 · J.M. Dutertre, R. Possamai Bastos, et al. · Microelectronics Reliability · 21
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CMOS/STT-MRAM Based Ascon LWC: a Power Efficient Hardware Implementation
2022 · Nathan Roussel, Oliver Potin, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 18
A passive pressure sensor for continuously measuring the intraocular pressure in glaucomatous patients
2012 · P. Auvray, L. Rousseau, et al. · IRBM · 16
A CFI Verification System based on the RISC-V Instruction Trace Encoder
2022 · Anthony Zgheib, Olivier Potin, et al. · Euromicro Conference on Digital System Design (DSD) · 14
Comparison of side-channel leakage on Rich and Trusted Execution Environments
2019 · Paul Leignac, Olivier Potin, et al. · 13
Filtering-based CPA
2017 · Karim M. Abdellatif, Damien Couroussé, et al. · 13
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Combined Fault Injection and Real-Time Side-Channel Analysis for Android Secure-Boot Bypassing
2023 · Clément Fanjas, Clément Gaine, et al. · Lecture notes in computer science · 12
On the Use of Redundancy to Reduce Prediction Error in Alternate Analog/RF Test
2012 · Haythem Ayari, Florence Azais, et al. · 12
Experimental analysis of the electromagnetic instruction skip fault model and consequences for software countermeasures
2021 · Jean-Max Dutertre, Alexandre Menu, et al. · Microelectronics Reliability · 10
Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron-Induced Transients
2020 · R. Possamai Bastos, J.-M. Dutertre, et al. · IEEE Transactions on Nuclear Science · 10
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC
2013 · V. Kerzérho, S. Bernard, et al. · Microelectronics Journal · 8
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Assessing body built-in current sensors for detection of multiple transient faults
2018 · R.A.C. Viera, J.-M. Dutertre, et al. · Microelectronics Reliability · 6
Montgomery Multiplication Scalable Systolic Designs Optimized for DSP48E2
2023 · Louis Noyez, Nadia El Mrabet, et al. · ACM Transactions on Reconfigurable Technology and Systems · 5
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Extending a RISC-V core with an AES hardware accelerator to meet IOT constraints
2021 · Anthony Zgheib, Olivier Potin, et al. · HAL (Le Centre pour la Communication Scientifique Directe) · 5
Using a Performance Model to Implement a Superscalar CVA6
2024 · Côme Allart, Jean-Roch Coulon, et al. · ACM International Conference on Computing Frontiers: Workshops and Special Sessions (CF Companion) · 4
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CIFER: Code Integrity and control Flow verification for programs Executed on a RISC-V core
2023 · Anthony Zgheib, Olivier Potin, et al. · IEEE International Symposium on Hardware Oriented Security and Trust (HOST) · 4
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Validation Of Single BBICS Architecture In Detecting Multiple Faults
2015 · Raphael Viera, Rodrigo Possamai Bastos, et al. · HAL (Le Centre pour la Communication Scientifique Directe) · 4
Adaptive LUT-based system for in situ ADC auto-correction
2010 · S. Bernard, F. Azais, et al. · IEEE International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) · 4
Modular Multiplication in the AMNS Representation: Hardware Implementation
2025 · Louis Noyez, Nadia El Mrabet, et al. · Lecture notes in computer science · 2
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Works count: 51
Citation count: 400
H-index: 12
I10-index: 16
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