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Author

Hatem Garrab

Observed names: GARRAB, Hatem, H. Garrab, Hatem GARRAB
Observed institutions: École Centrale de Lyon, Centre National de la Recherche Scientifique, University of Monastir, Laboratoire Ampère, Institut National des Sciences Appliquées de Lyon, University of Sousse
ORCID: 0000-0002-4404-5986
Observed ORCID: 0000-0002-4404-5986
OpenAlex ID: A5033535666
On the Extraction of PiN Diode Design Parameters for Validation of Integrated Power Converter Design
2005 · H. Garrab, B. Allard, et al. · IEEE Transactions on Power Electronics · 62
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On the Role of the N–N$^{+}$ Junction Doping Profile of a PIN Diode on Its Turn-Off Transient Behavior
2008 · Bruno Allard, Hatem Garrab, et al. · IEEE Transactions on Power Electronics · 22
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A Novel Approach to Extract the Thyristor Design Parameters for Designing of Power Electronic Systems
2014 · Atef Jedidi, Hatem Garrab, et al. · IEEE Transactions on Industrial Electronics · 17
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A novel approach to extract accurate design parameters of PiN diode
2007 · Tarek Ben Salah, Sami Ghédira, et al. · International Journal of Numerical Modelling Electronic Networks Devices and Fields · 14
Role of the temperature distribution on the PN junction behaviour in the electro‐thermal simulation
2004 · Hatem Garrab, Bruno Allard, et al. · International Journal of Numerical Modelling Electronic Networks Devices and Fields · 13
Switching parameter maps-a new approach to the validity domain of power device models
2004 · B. Allard, H. Garrab, et al. · IEEE Annual Conference on Power Electronics Specialist · 13
A Novel Approach to Accurately Determine the $t_{q}$ Parameter of Thyristors
2016 · Hatem Garrab, Atef Jedidi, et al. · IEEE Transactions on Industrial Electronics · 10
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A novel design approach for the epitaxial layer for 4H-SiC and 6H-SiC power bipolar devices
2006 · Tarek Ben Salah, Hatem Garrab, et al. · Superlattices and Microstructures · 10
Field Validated Hybrid ESP-NOW and Long Range IoT Monitoring System for Energy Autonomous Precision Agriculture
2025 · Ali Abdelli, Wissem Boujnah, et al. · IEEE Access · 8
Reliability of LEON3 Processor’s Program Counter Against SEU, MBU, and SET Fault Injection
2025 · Afef Kchaou, Sehmi Saad, et al. · Cryptography · 5
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The Role of a Wiring Model in Switching Cell Transients: the PiN Diode Turn-off Case
2017 · Atef Jedidi, Hatem Garrab, et al. · Journal of Power Electronics · 5
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Electro-thermal simulation including a temperature distribution inside power semiconductor devices
2005 · B. Allard *, H. Garrab, et al. · International Journal of Electronics · 5
A Linear and High-Sensitivity Microwave Biosensor on a FR-4 Substrate for Aqueous Glucose Monitoring Using a Concentric Square-Shaped Split-Ring Resonator
2025 · Khouloud Jomaa, Sehmi Saad, et al. · Sensors · 4
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Emulation-Based Analysis of Multiple Cell Upsets in LEON3 SDRAM: A Workload-Dependent Vulnerability Study
2025 · Afef Kchaou, Sehmi Saad, et al. · Electronics · 4
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The advantage of silicon carbide material in designing of power bipolar junction transistors
2015 · Mehrez Oueslati, Hatem Garrab, et al. · International Multi-Conference on Systems, Signals & Devices (SSD) · 4
Workload-Dependent Vulnerability of SDRAM Multi-Bit Upsets in a LEON3 Soft-Core Processor
2025 · Afef Kchaou, Sehmi Saad, et al. · Electronics · 3
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An exprimental procedure to extract the tq parameter of thyristors
2017 · Atef Jedidi, Hatem Garrab, et al. · International Conference on Engineering & MIS (ICEMIS) · 2
A comparative study between 4H-SiC and silicon power PiN diode having the same breakdown voltage 4KV
2013 · Atef Jedidi, Hatem Garrab, et al. · International Conference on Electrical Engineering and Software Applications · 2
Contribution à la modélisation électro-thermique de la cellule de commutation MOSFET-Diode
2003 · Hatem Garrab · 2
YOLO11-MSCA: A Multi-Scale Channel Attention Model for Lumbar Vertebra Detection in X-Ray Images
2026 · Hana Ben Fredj, Hatem Garrab, et al. · Electronics · 1
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Reliability Analysis of the LEON3 Memory Subsystem Under Single-Event Upsets: Cache, AHB Interface, and Memory Controller Vulnerability
2026 · Afef Kchaou, Sehmi Saad, et al. · Information · 1
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Electro-Optical Voltage Probe on the Pockels Effect: Experimental Validation Up to 4-kV
2026 · Tarek Ben Salah, Hatem Garrab, et al. · IEEE Access · 1
Recent Advances in Single-Ended Gyrator–C Active Inductor Designs (Innovations from 2008)
2025 · Sehmi Saad, Hatem Garrab · 1
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Sustainable Power Solutions for Healthcare: Energy Harvesting and Wireless Power Transfer
2025 · Nesrine Hedhili, Hatem Garrab · 1
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Improved WPT system using a conical coil for charging a Smart device that controls patients with Alzheimer's disease
2024 · Yosra Ben Fadhel, Achraf Derbel, et al. · International Multi-Conference on Systems, Signals & Devices (SSD) · 1
Works count: 50
Citation count: 215
H-index: 8
I10-index: 8
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