Author

Mukunda Khanal

Institution: Lamar University
Observed institution: Lamar University
ORCID: 0000-0002-5192-1868
Observed ORCID: 0000-0002-5192-1868
OpenAlex ID: A5033617910
2022 · Md Ashraful Hoque, Chun-Wei Yao, et al. · Sensors · 33
2022 · Sushil Doranga, Matthew Schuldt, et al. · Materials · 24
2023 · Mathews T Vellukunnel, Mukunda Khanal, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 12
2022 · Negar Saraei, Mukunda Khanal, et al. · Computational Research Progress in Applied Science and Engineering · 9
2024 · Sushil Doranga, Sima Besharat Ferdowsi, et al. · Microelectronics Reliability · 7
2023 · Mukunda Khanal, Jiang Zhou, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 4
2024 · Mukunda Khanal, Jenny Zhou, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 2
2022 · Mukunda Khanal, Nischal Kharel, et al. · Computational Research Progress in Applied Science and Engineering · 1
2026 · Sima Besharat Ferdowsi, Sushil Doranga, et al. · Journal of Electronic Packaging
Works count: 11
Citation count: 107
H-index: 7
I10-index: 3
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