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Wouter Van den Broek

Observed names: Broek, W van den, Broek, Wouter Van den, Broek, Wouter van den, Van Den Broek, Wouter, Van den Broek, Wouter, W Van den Broek, W. VAN DEN BROEK, W. Van Den Broek, W. Van den Broek, Wouter Van Den Broek
Observed institutions: University of Antwerp, Universität Ulm, Cornell University, Humboldt-Universität zu Berlin, Thermo Fisher Scientific (Netherlands), Technische Universität Dresden
ORCID: 0000-0002-6553-4578
Observed ORCID: 0000-0002-6553-4578
OpenAlex ID: A5033703793
Atomic-scale determination of surface facets in gold nanorods
2012 · Bart Goris, Sara Bals, et al. · Nature Materials · 345
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
2016 · A. De Backer, K.H.W. van den Bos, et al. · Ultramicroscopy · 283
Electron tomography based on a total variation minimization reconstruction technique
2011 · B. Goris, W. Van den Broek, et al. · Ultramicroscopy · 235
A novel quasi-one-dimensional topological insulator in bismuth iodide β-Bi4I4
2015 · Gabriel Autès, Anna Isaeva, et al. · Nature Materials · 130
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Correction of non-linear thickness effects in HAADF STEM electron tomography
2012 · W. Van den Broek, A. Rosenauer, et al. · Ultramicroscopy · 88
Method for Retrieval of the Three-Dimensional Object Potential by Inversion of Dynamical Electron Scattering
2012 · Wouter Van den Broek, Christoph T. Koch · Physical Review Letters · 81
General framework for quantitative three-dimensional reconstruction from arbitrary detection geometries in TEM
2013 · Wouter Van den Broek, Christoph T. Koch · Physical Review B · 60
A practical method to determine the effective resolution in incoherent experimental electron tomography
2011 · Hamed Heidari Mezerji, Wouter Van den Broek, et al. · Ultramicroscopy · 52
Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization
2020 · Marcel Schloz, Thomas Christopher Pekin, et al. · Optics Express · 48
A holographic method to measure the source size broadening in STEM
2012 · Jo Verbeeck, Armand Béché, et al. · Ultramicroscopy · 38
Crystal Growth and Real Structure Effects of the First Weak 3D Stacked Topological Insulator Bi14Rh3I9
2013 · Bertold Rasche, Anna Isaeva, et al. · Chemistry of Materials · 37
Optimization of a FIB/SEM slice‐and‐view study of the 3D distribution of Ni4Ti3 precipitates in Ni–Ti
2009 · S. CAO, W. TIRRY, et al. · Journal of Microscopy · 33
FDES, a GPU-based multislice algorithm with increased efficiency of the computation of the projected potential
2015 · W. Van den Broek, X. Jiang, et al. · Ultramicroscopy · 29
Deep reinforcement learning for data-driven adaptive scanning in ptychography
2023 · Marcel Schloz, Johannes Müller, et al. · Scientific Reports · 27
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Exploring different inelastic projection mechanisms for electron tomography
2011 · B. Goris, S. Bals, et al. · Ultramicroscopy · 27
Modular Design with 2D Topological-Insulator Building Blocks: Optimized Synthesis and Crystal Growth and Crystal and Electronic Structures of BixTeI (x = 2, 3)
2017 · Alexander Zeugner, Martin Kaiser, et al. · Chemistry of Materials · 26
Third-dimension information retrieval from a single convergent-beam transmission electron diffraction pattern using an artificial neural network
2014 · Robert S. Pennington, Wouter Van den Broek, et al. · Physical Review B · 26
Fully Automated Measurement of the Modulation Transfer Function of Charge-Coupled Devices above the Nyquist Frequency
2012 · Wouter Van den Broek, Sandra Van Aert, et al. · Microscopy and Microanalysis · 22
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy
2009 · W. Van den Broek, S. Van Aert, et al. · Ultramicroscopy · 22
A model based atomic resolution tomographic algorithm
2009 · W. Van den Broek, S. Van Aert, et al. · Ultramicroscopy · 22
Model-based electron microscopy: From images toward precise numbers for unknown structure parameters
2011 · S. Van Aert, W. Van den Broek, et al. · Micron · 20
Defocus and twofold astigmatism correction in HAADF-STEM
2011 · M.E. Rudnaya, W. Van den Broek, et al. · Ultramicroscopy · 20
Introducing measure-by-wire, the systematic use of systems and control theory in transmission electron microscopy
2011 · Arturo Tejada, Arnold J. den Dekker, et al. · Ultramicroscopy · 17
Inverse dynamical photon scattering (IDPS): an artificial neural network based algorithm for three-dimensional quantitative imaging in optical microscopy
2016 · Xiaoming Jiang, Wouter Van den Broek, et al. · Optics Express · 13
Throughput maximization of particle radius measurements through balancing size versus current of the electron probe
2010 · W. Van den Broek, S. Van Aert, et al. · Ultramicroscopy · 13
Works count: 77
Citation count: 1,876
H-index: 20
I10-index: 28
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