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Ramendra Singh
Observed name:
R. Singh
Observed institutions:
Alcatel-Lucent (France),
Indian Institute of Technology Delhi
ORCID:
0000-0002-4256-6905
Observed ORCID:
0000-0002-4256-6905
OpenAlex ID:
A5033788696
Evaluation of 10-nm Bulk FinFET RF Performance—Conventional Versus NC-FinFET
2018
·
R. Singh
, K. Aditya
, et al.
·
IEEE Electron Device Letters
·
66
3-D LER and RDF Matching Performance of Nanowire FETs in Inversion, Accumulation, and Junctionless Modes
2018
·
Anil K. Bansal
, Charu Gupta
, et al.
·
IEEE Transactions on Electron Devices
·
38
Experimental Evaluation of Self-Heating and Analog/RF FOM in GAA-Nanowire FETs
2019
·
Ramendra Singh
, Kritika Aditya
, et al.
·
IEEE Transactions on Electron Devices
·
20
COM2 SiGe modular BiCMOS technology for digital, mixed-signal, and RF applications
2002
·
M. Carroll
, T. Ivanov
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
15
Impact of Gamma-Ray Radiation on DC and RF Performance of 10-nm Bulk N-Channel FinFETs
2020
·
K. Aditya
, R. Singh
, et al.
·
IEEE Transactions on Device and Materials Reliability
·
14
Analytical Modeling of Parasitic Capacitance in Inserted-Oxide FinFETs
2017
·
Ramendra Singh
, Anshul Gupta
, et al.
·
IEEE Transactions on Electron Devices
·
12
Effect of Post Radiation Annealing on the TID Response of 0.18μm bulk NFETs
2019
·
Kritika Aditya
, Manoj Kumar
, et al.
·
IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
·
9
Electronically tunable compact inductance simulator with experimental verification
2023
·
Kapil Bhardwaj
, Mayank Srivastava
, et al.
·
ETRI Journal
·
6
PDF
Characterization and Global Parameter Extraction of bulk MOSFETs using BSIM-BULK Model
2018
·
Shivendra S. Parihar
, Chandan Jha
, et al.
·
IEEE Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON)
·
6
7-nm Nanowire FET process variation modeling using industry standard BSIM-CMG model
2016
·
Ramendra Singh
, Kritika Aditya
, et al.
·
International Conference on Emerging Electronics (ICEE)
·
6
Critical technical aspects during design, manufacturing and testing of India's first 1200 kV UHVAC transformer
2012
·
Ritu Tiwari
, Shailendra K. Gupta
, et al.
·
Water and Energy International
·
4
SEU Sensitivity of a 14-nm SOI FinFET eDRAM Cell under Heavy-ion Irradiation
2018
·
Kritika Aditya
, Rohit Saini
, et al.
·
IEEE International Conference on Emerging Electronics (ICEE)
·
3
Characterization and modeling of N-channel bulk FinFETs from DC to high frequency
2017
·
Ramendra Singh
, Pragya Kushwaha
, et al.
·
IEEE Conference on Electron Devices and Solid-State Circuits
·
3
Superior Transient Response to Heavy-Ion Irradiation by N-Channel SOI-iFinFETs
2019
·
Kritika Aditya
, Ramendra Singh
, et al.
·
IETE Journal of Research
·
2
An investigation of reliability and variability issues in nanoscale SOI and multi-gate MOSFETs: modelling, simulation and characterization
2019
·
Manoj Kumar
, Kritika Aditya
, et al.
·
CSI Transactions on ICT
·
2
Impact of SOI thickness scaling on alpha-particle irradiation performance of MOSFETs
2017
·
Kritika Aditya
, Rohit Saini
, et al.
·
IEEE Conference on Electron Devices and Solid-State Circuits
·
1
Construction of Sziklai Pair using Mixed Components
2017
·
Ramendra Singh
, Ankit Tripathi
, et al.
·
IOP Conference Series Materials Science and Engineering
·
1
PDF
Development of India’s First Phase Shifting Transformer
2013
·
S. Sachdeva
, Ramendra Singh
, et al.
·
Water and Energy International
·
1
Compact and High-Speed All-Optical 2n:1 Multiplexer Scheme Using MRRs
2023
·
Mayank Srivastava
, Ajay Kumar
, et al.
·
Journal of Circuits Systems and Computers
DC to RF characterization, modeling, and simulation of multiple-gate FETs in sub-14nm CMOS technologies
2019
·
Ramendra Singh
Effect of Process Parameters on Bead Penetration in Saw (sub-merged arc welding) using Taguchi L9 Array
2015
·
Ramendra Singh
, Vinay Pratap Singh
, et al.
·
Invertis Journal of Science & Technology
Electrical properties ofAu /n -Si,Au/n-GaAs,Au/n-InPschottky diodes
2010
·
Ramendra Singh
·
Materials science : an Indian journal
Effect of swift heavy ion irradiation on the electrical characteristics of Ag/n-Si Schottky diode
2000
·
Ramendra Singh
, S. K. Arora
, et al.
Comment on “Effects of Corona‐Discharge‐Induced Oxygen Ion Beams and Electric Fields on Silicon Oxidation Kinetics” [J. Electrochem. Soc., 132, 1659]: II . Electric Field Effects
1988
·
R. Rajsuman
, R. Singh
·
Journal of The Electrochemical Society
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Works count:
24
Citation count:
209
H-index:
7
I10-index:
6
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